Invention Application
WO2005043249A3 COMPOSITE OPTICAL LITHOGRAPHY METHOD FOR PATTERNING LINES OF UNEQUAL WIDTH
审中-公开
用于绘制不平度宽度线的复合光学平移方法
- Patent Title: COMPOSITE OPTICAL LITHOGRAPHY METHOD FOR PATTERNING LINES OF UNEQUAL WIDTH
- Patent Title (中): 用于绘制不平度宽度线的复合光学平移方法
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Application No.: PCT/US2004034599Application Date: 2004-10-18
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Publication No.: WO2005043249A3Publication Date: 2005-09-15
- Inventor: BORODOVSKY YAN
- Applicant: INTEL CORP , BORODOVSKY YAN
- Assignee: INTEL CORP,BORODOVSKY YAN
- Current Assignee: INTEL CORP,BORODOVSKY YAN
- Priority: US68103003 2003-10-07
- Main IPC: G03F7/20
- IPC: G03F7/20
Abstract:
A composite patterning technique may include two lithography processes. A first lithography process may use interference lithography to form an interference pattern of lines of substantially equal width and spaces on a photoresist. A second lithography process may use one or more non-interference lithography techniques, such as optical lithography, imprint lithography and electron-beam lithography, to break continuity of the patterned lines and form desired integrated circuit features.
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