Invention Application
WO2005043249A3 COMPOSITE OPTICAL LITHOGRAPHY METHOD FOR PATTERNING LINES OF UNEQUAL WIDTH 审中-公开
用于绘制不平度宽度线的复合光学平移方法

COMPOSITE OPTICAL LITHOGRAPHY METHOD FOR PATTERNING LINES OF UNEQUAL WIDTH
Abstract:
A composite patterning technique may include two lithography processes. A first lithography process may use interference lithography to form an interference pattern of lines of substantially equal width and spaces on a photoresist. A second lithography process may use one or more non-interference lithography techniques, such as optical lithography, imprint lithography and electron-beam lithography, to break continuity of the patterned lines and form desired integrated circuit features.
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