Invention Application
WO2005076885A2 CONTACTLESS INTERFACING OF TEST SIGNALS WITH A DEVICE UNDER TEST
审中-公开
与测试设备的测试信号的接触式接口
- Patent Title: CONTACTLESS INTERFACING OF TEST SIGNALS WITH A DEVICE UNDER TEST
- Patent Title (中): 与测试设备的测试信号的接触式接口
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Application No.: PCT/US2005/003360Application Date: 2005-02-02
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Publication No.: WO2005076885A2Publication Date: 2005-08-25
- Inventor: MILLER, Charles, A.
- Applicant: FORMFACTOR, INC. , MILLER, Charles, A.
- Applicant Address: 7005 Southfront Road, Livermore, California 94551 US
- Assignee: FORMFACTOR, INC.,MILLER, Charles, A.
- Current Assignee: FORMFACTOR, INC.,MILLER, Charles, A.
- Current Assignee Address: 7005 Southfront Road, Livermore, California 94551 US
- Agency: MERKADEAU, Stuart, L.
- Priority: US10/772,970 20040205
- Main IPC: G01R31/311
- IPC: G01R31/311
Abstract:
An interface device receives test data from a tester. A signal representing the test data is transmitted to a device under test through electromagnetically coupled structures on the interface device and the device under test. The device under test processes the test data and generates response data. A signal representing the response data is transmitted to the interface device through electromagnetically coupled structures on the device under test and the interface device.
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