Invention Application
WO2005081001A1 PROBING A DEVICE 审中-公开
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PROBING A DEVICE
Abstract:
An electronic device is moved into a first position such that terminals of the electronic device are adjacent probes for making electrical contact with the terminals. The electronic device is then moved horizontally or diagonally such that the terminals contact the probes. Test data are then communicated to and from the electronic device through the probes.
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