Invention Application
- Patent Title: METHODS AND SYSTEMS FOR FEATURE SELECTION
- Patent Title (中): 特征选择的方法和系统
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Application No.: PCT/US2005/023018Application Date: 2005-06-27
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Publication No.: WO2006004797A2Publication Date: 2006-01-12
- Inventor: LIU, Yan , KENDER, John, R.
- Applicant: THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OFNEW YORK , LIU, Yan , KENDER, John, R.
- Applicant Address: 110 Low Memorial Library, 535 West 116th Street, New York, NY 10027 US
- Assignee: THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OFNEW YORK,LIU, Yan,KENDER, John, R.
- Current Assignee: THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OFNEW YORK,LIU, Yan,KENDER, John, R.
- Current Assignee Address: 110 Low Memorial Library, 535 West 116th Street, New York, NY 10027 US
- Agency: BYRNE, Matthew, T. et al.
- Priority: US60/582853 20040625
- Main IPC: G06K9/62
- IPC: G06K9/62
Abstract:
Methods and systems for feature selection are described. In particular, methods and systems for feature selection for data classification, retrieval, and segmentation are described. Certain embodiments of the invention are directed to methods and systems for complement sort-merge tree (CSMT), fast-converging sort-merge tree (FSMT), and multi-level (ML) feature selection. Accurate and fast results may be obtained by the feature selection methods and systems described herein.
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