Invention Application
- Patent Title: CALIBRATION FOR SPECTROSCOPIC ANALYSIS
- Patent Title (中): 光谱分析校准
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Application No.: PCT/IB2005/052760Application Date: 2005-08-23
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Publication No.: WO2006021926A1Publication Date: 2006-03-02
- Inventor: RENSEN, Wouter
- Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V. , RENSEN, Wouter
- Applicant Address: Groenewoudseweg 1, NL-5621 BA Eindhoven NL
- Assignee: KONINKLIJKE PHILIPS ELECTRONICS N.V.,RENSEN, Wouter
- Current Assignee: KONINKLIJKE PHILIPS ELECTRONICS N.V.,RENSEN, Wouter
- Current Assignee Address: Groenewoudseweg 1, NL-5621 BA Eindhoven NL
- Agency: CHAFFRAIX, Jean
- Priority: EP04104086.6 20040826
- Main IPC: G01J3/36
- IPC: G01J3/36 ; G01J3/04
Abstract:
The present invention provides an optical analysis system for determining an amplitude of a principal component of an optical signal. The principle component is indicative of the concentration of a particular compound of various compounds of a substance that is subject to spectroscopic analysis. The optical signal is subject to a wavelength selective weighting. Spectral weighting is preferably performed by means of spatial light manipulation means in combination with a dispersive optical element. The inventive calibration mechanism and method effectively allows for an accurate positioning of the spatial light manipulation means. Calibration is based on a calibration segment on the spatial light manipulation means in combination with a reference light source and a detector.
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