Invention Application
WO2006121874A3 MEMORY DEVICE AND METHOD HAVING A DATA BYPASS PATH TO ALLOW RAPID TESTING AND CALIBRATION
审中-公开
具有数据旁路的存储器件和方法允许快速测试和校准
- Patent Title: MEMORY DEVICE AND METHOD HAVING A DATA BYPASS PATH TO ALLOW RAPID TESTING AND CALIBRATION
- Patent Title (中): 具有数据旁路的存储器件和方法允许快速测试和校准
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Application No.: PCT/US2006017439Application Date: 2006-05-04
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Publication No.: WO2006121874A3Publication Date: 2007-08-02
- Inventor: JOHNSON JAMES B , MANNING TROY A
- Applicant: MICRON TECHNOLOGY INC , JOHNSON JAMES B , MANNING TROY A
- Assignee: MICRON TECHNOLOGY INC,JOHNSON JAMES B,MANNING TROY A
- Current Assignee: MICRON TECHNOLOGY INC,JOHNSON JAMES B,MANNING TROY A
- Priority: US12400205 2005-05-06
- Main IPC: G01R31/26
- IPC: G01R31/26
Abstract:
A synchronous dynamic random access memory ("SDRAM") device (100) includes a pipelined write data path coupling data from a data bus to a DRAM array (122), and a pipelined read data path coupling read data from the array ((122) to the data bus. The SDRAM device also includes a bypass path allowing the write data in the write data path to be coupled directly to the read data path without firs being stored in the DRAM array. The write data are preferably coupled through the write data path by issuing a write command to the DRAM device, and the read data are preferably coupled through the read data path by issuing a read command to the DRAM device. The memory array is inhibited from responding to these commands so that the write data are not stored in the array, and read data from the array are not coupled to the read data path.
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