Invention Application
WO2006131656A2 EQUIPMENT FOR NON-CONTACT TEMPERATURE MEASUREMENT OF SAMPLES OF MATERIALS ARRANGED UNDER VACUUM
审中-公开
非接触式温度测量设备在真空下安装的材料样品
- Patent Title: EQUIPMENT FOR NON-CONTACT TEMPERATURE MEASUREMENT OF SAMPLES OF MATERIALS ARRANGED UNDER VACUUM
- Patent Title (中): 非接触式温度测量设备在真空下安装的材料样品
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Application No.: PCT/FR2006001305Application Date: 2006-06-07
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Publication No.: WO2006131656A2Publication Date: 2006-12-14
- Inventor: SEMPRIMOSCHNIG CHRISTOPH , VAN EESBEEK MARC R J , HELTZEL STAN
- Applicant: AGENCE SPATIALE EUROPEENNE , SEMPRIMOSCHNIG CHRISTOPH , VAN EESBEEK MARC R J , HELTZEL STAN
- Assignee: AGENCE SPATIALE EUROPEENNE,SEMPRIMOSCHNIG CHRISTOPH,VAN EESBEEK MARC R J,HELTZEL STAN
- Current Assignee: AGENCE SPATIALE EUROPEENNE,SEMPRIMOSCHNIG CHRISTOPH,VAN EESBEEK MARC R J,HELTZEL STAN
- Priority: FR0551563 2005-06-09
- Main IPC: G01N25/72
- IPC: G01N25/72 ; G01J5/04
Abstract:
The invention concerns an equipment for non-contact temperature measurement (1) of samples of materials (2) arranged in a vacuum chamber (12). A UV lamp (6) illuminates the samples (2) through a window (4), so as to subject them to a predetermined thermal cycle and to perform an environmental test, in particular for materials designed for space missions. An external pyrometer measures the temperature of the samples (2) through a window (6). It is associated with a scanning module (9) including a mobile mirror, with two axes of rotation and three orthogonal axes of translation, arranged on the optical path of the infrared radiation (Rir) so as to obtain a two-dimensional scanning of each sample (2) by means of a measuring spot focused on the surface of the samples. In a preferred embodiment, the samples are of slight thickness and locked pressed against a convex support. The whole assembly is monitored by an automatic data processing system with recorded programme (10).
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