Invention Application
WO2006131656A2 EQUIPMENT FOR NON-CONTACT TEMPERATURE MEASUREMENT OF SAMPLES OF MATERIALS ARRANGED UNDER VACUUM 审中-公开
非接触式温度测量设备在真空下安装的材料样品

EQUIPMENT FOR NON-CONTACT TEMPERATURE MEASUREMENT OF SAMPLES OF MATERIALS ARRANGED UNDER VACUUM
Abstract:
The invention concerns an equipment for non-contact temperature measurement (1) of samples of materials (2) arranged in a vacuum chamber (12). A UV lamp (6) illuminates the samples (2) through a window (4), so as to subject them to a predetermined thermal cycle and to perform an environmental test, in particular for materials designed for space missions. An external pyrometer measures the temperature of the samples (2) through a window (6). It is associated with a scanning module (9) including a mobile mirror, with two axes of rotation and three orthogonal axes of translation, arranged on the optical path of the infrared radiation (Rir) so as to obtain a two-dimensional scanning of each sample (2) by means of a measuring spot focused on the surface of the samples. In a preferred embodiment, the samples are of slight thickness and locked pressed against a convex support. The whole assembly is monitored by an automatic data processing system with recorded programme (10).
Patent Agency Ranking
0/0