Automatic test equipment (ATE) includes circuitry configured to pass a signal in a channel of the ATE, and memory configured to store a first look-up table (LUT) and a second LUT. The first LUT is configured to provide a first correction value based on a first version of the signal, where the first correction value are for use in correcting static non-linearity associated with the channel. The second LUT is configured to provide a second correction value based on a second version of the signal, where the second correction value are for use in correcting dynamic non-linearity associated with the channel. Digital signal processing logic is configured to use the first correction value, the second correction value, and the signal in order to compensate for harmonic distortion from the channel.