Invention Application
- Patent Title: APPARATUS FOR MEASUREMENT OF THREE-DIMENSIONAL SHAPE
- Patent Title (中): 三维形状测量装置
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Application No.: PCT/KR2008/002968Application Date: 2008-05-28
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Publication No.: WO2008147098A1Publication Date: 2008-12-04
- Inventor: LEE, Sang-yun , KANG, Min-gu , LIM, Ssang-gun
- Applicant: INTEKPLUS CO., LTD , LEE, Sang-yun , KANG, Min-gu , LIM, Ssang-gun
- Applicant Address: 537 Yongsan-dong, Yuseong-gu Daejeon 305-500 KR
- Assignee: INTEKPLUS CO., LTD,LEE, Sang-yun,KANG, Min-gu,LIM, Ssang-gun
- Current Assignee: INTEKPLUS CO., LTD,LEE, Sang-yun,KANG, Min-gu,LIM, Ssang-gun
- Current Assignee Address: 537 Yongsan-dong, Yuseong-gu Daejeon 305-500 KR
- Agency: CENTRAL INTERNATIONAL PATENT FIRM
- Priority: KR10-2007-0052290 20070529
- Main IPC: G01B11/25
- IPC: G01B11/25
Abstract:
An apparatus for measurement of a three-dimensional shape includes a light source, a beam splitter splitting a light emitted from the light source, a measured object projected with the light from the light source, having a height difference between a highest point and a lowest point thereof, a reference plane projected with the light emitted from the beam splitter, a photographing device photographing an interference fringe formed by the lights reflected from a surface of the measured object and from the reference plane and composed, and a controlling computer processing the image photographed by the photographing device. The reference plane further includes a reflection path adjusting unit which supplies reflection paths respectively equal to a reflection path from the highest point and a reflection path from the lowest point of the measured object.
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