Invention Application
WO2009100073A3 METHOD AND APPARATUS FOR NORMALIZING PERFORMANCE OF AN ELECTRON SOURCE
审中-公开
用于规范电子源性能的方法和设备
- Patent Title: METHOD AND APPARATUS FOR NORMALIZING PERFORMANCE OF AN ELECTRON SOURCE
- Patent Title (中): 用于规范电子源性能的方法和设备
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Application No.: PCT/US2009032977Application Date: 2009-02-03
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Publication No.: WO2009100073A3Publication Date: 2009-11-19
- Inventor: QUARMBY SCOTT T , GUCKENBERGER GEORGE B , MCCAULEY EDWARD B
- Applicant: THERMO FINNIGAN LLC , QUARMBY SCOTT T , GUCKENBERGER GEORGE B , MCCAULEY EDWARD B
- Assignee: THERMO FINNIGAN LLC,QUARMBY SCOTT T,GUCKENBERGER GEORGE B,MCCAULEY EDWARD B
- Current Assignee: THERMO FINNIGAN LLC,QUARMBY SCOTT T,GUCKENBERGER GEORGE B,MCCAULEY EDWARD B
- Priority: US2648908 2008-02-05
- Main IPC: H01J49/14
- IPC: H01J49/14 ; H01J27/20
Abstract:
A method for operating a mass spectrometer includes determining a first performance characteristic while operating the mass spectrometer with a first electron emitter, storing first information relating to the first performance characteristic, determining a second performance characteristic while operating the mass spectrometer with a second electron emitter, storing second information relating to the second performance characteristic, and thereafter switching from operation using the first electron emitter to operation using the second electron emitter. The switching includes using the first and second information to normalize performance of the second electron emitter after the switching relative to performance of the first electron emitter before the switching.
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