Invention Application
- Patent Title: THROUGH SUBSTRATE VIA INCLUDING VARIABLE SIDEWALL PROFILE
- Patent Title (中): 通过基础包括可变的平台轮廓
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Application No.: PCT/US2009/042206Application Date: 2009-04-30
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Publication No.: WO2009137313A1Publication Date: 2009-11-12
- Inventor: COONEY, Edward, Crandal , LINDGREN, Peter, James , OSSENKOP, Dorreen, Jane , STAMPER, Anthony, Kendall
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION , COONEY, Edward, Crandal , LINDGREN, Peter, James , OSSENKOP, Dorreen, Jane , STAMPER, Anthony, Kendall
- Applicant Address: New Orchard Road Armonk, NY 10504 US
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION,COONEY, Edward, Crandal,LINDGREN, Peter, James,OSSENKOP, Dorreen, Jane,STAMPER, Anthony, Kendall
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION,COONEY, Edward, Crandal,LINDGREN, Peter, James,OSSENKOP, Dorreen, Jane,STAMPER, Anthony, Kendall
- Current Assignee Address: New Orchard Road Armonk, NY 10504 US
- Agency: KOTULAK, Richard, M.
- Priority: US12/115,564 20080506
- Main IPC: H01L21/441
- IPC: H01L21/441 ; H01L29/417
Abstract:
A microelectronic structure, such as a semiconductor structure, and a method for fabricating the microelectronic structure, include an aperture (R1-RA) within a substrate. (16) Into the aperture is located and formed a via. The via may include a through substrate via. The aperture includes, progressing sequentially contiguously at least partially through the substrate: (1) a first comparatively wide region (R1) at a surface of the substrate; (2) a constricted region contiguous (R2) with the first comparatively wide region; (3) a second comparatively wide region contiguous (R3) with the constricted region; and (4) a tapered region contiguous (R4) with the second comparatively wide region. The structure of the aperture provides for ease in filling the aperture, as well as void isolation within the via.
Information query
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