Invention Application
- Patent Title: COBALT DEPOSITION ON BARRIER SURFACES
- Patent Title (中): 在屏障表面的钴沉积
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Application No.: PCT/US2009/054307Application Date: 2009-08-19
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Publication No.: WO2010025068A2Publication Date: 2010-03-04
- Inventor: LU, Jiang , HA, Hyoung-Chan , MA, Paul , GANGULI, Seshadri , AUBUCHON, Joseph, F. , YU, Sang Ho , NARASIMHAN, Murali
- Applicant: APPLIED MATERIALS, INC. , LU, Jiang , HA, Hyoung-Chan , MA, Paul , GANGULI, Seshadri , AUBUCHON, Joseph, F. , YU, Sang Ho , NARASIMHAN, Murali
- Applicant Address: 3050 Bowers Avenue Santa Clara, CA 95054 US
- Assignee: APPLIED MATERIALS, INC.,LU, Jiang,HA, Hyoung-Chan,MA, Paul,GANGULI, Seshadri,AUBUCHON, Joseph, F.,YU, Sang Ho,NARASIMHAN, Murali
- Current Assignee: APPLIED MATERIALS, INC.,LU, Jiang,HA, Hyoung-Chan,MA, Paul,GANGULI, Seshadri,AUBUCHON, Joseph, F.,YU, Sang Ho,NARASIMHAN, Murali
- Current Assignee Address: 3050 Bowers Avenue Santa Clara, CA 95054 US
- Agency: PATTERSON, B., Todd et al.
- Priority: US12/201,976 20080829
- Main IPC: H01L21/28
- IPC: H01L21/28 ; H01L21/205
Abstract:
Embodiments of the invention provide processes for depositing a cobalt layer on a barrier layer and subsequently depositing a conductive material, such as copper or a copper alloy, thereon. In one embodiment, a method for depositing materials on a substrate surface is provided which includes forming a barrier layer on a substrate, exposing the substrate to dicobalt hexacarbonyl butylacetylene (CCTBA) and hydrogen to form a cobalt layer on the barrier layer during a vapor deposition process (e.g., CVD or ALD), and depositing a conductive material over the cobalt layer. In some examples, the barrier layer and/or the cobalt layer may be exposed to a gas or a reagent during a treatment process, such as a thermal process, an in situ plasma process, or a remote plasma process.
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