Invention Application
- Patent Title: A SIGNAL GENERATOR FOR A BUILT-IN SELF TEST
- Patent Title (中): 用于内置自检的信号发生器
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Application No.: PCT/US2011/035791Application Date: 2011-05-09
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Publication No.: WO2011140563A1Publication Date: 2011-11-10
- Inventor: BANERJEE, Gaurab , BEHERA, Manas
- Applicant: QUALCOMM INCORPORATED , BANERJEE, Gaurab , BEHERA, Manas
- Applicant Address: Attn: International IP Administration 5775 Morehouse Drive San Diego, CA 92121 US
- Assignee: QUALCOMM INCORPORATED,BANERJEE, Gaurab,BEHERA, Manas
- Current Assignee: QUALCOMM INCORPORATED,BANERJEE, Gaurab,BEHERA, Manas
- Current Assignee Address: Attn: International IP Administration 5775 Morehouse Drive San Diego, CA 92121 US
- Agency: HOOKS, William, M.
- Priority: US12/776,168 20100507
- Main IPC: G01R31/3167
- IPC: G01R31/3167 ; G01R31/28 ; H03M1/10
Abstract:
An integrated circuit with Built-in Self Test (BiST) is described. The integrated circuit includes a signal generator used to perform a BiST on the integrated circuit. The integrated circuit also includes a local oscillator used by the signal generator to generate one or more test signals used to perform the BiST on the integrated circuit.
Information query
