Invention Application
- Patent Title: SYSTEM AND METHOD FOR MEASURING A DISTANCE
- Patent Title (中): 用于测量距离的系统和方法
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Application No.: PCT/US2011/066234Application Date: 2011-12-20
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Publication No.: WO2012094146A1Publication Date: 2012-07-12
- Inventor: HONG, John, H. , MA, Jian , CHANG, Tallis, Y.
- Applicant: QUALCOMM MEMS TECHNOLOGIES, INC. , HONG, John, H. , MA, Jian , CHANG, Tallis, Y.
- Applicant Address: 5775 Morehouse Drive San Diego, CA 92121 US
- Assignee: QUALCOMM MEMS TECHNOLOGIES, INC.,HONG, John, H.,MA, Jian,CHANG, Tallis, Y.
- Current Assignee: QUALCOMM MEMS TECHNOLOGIES, INC.,HONG, John, H.,MA, Jian,CHANG, Tallis, Y.
- Current Assignee Address: 5775 Morehouse Drive San Diego, CA 92121 US
- Agency: ABUMERI, Mark, M. et al.
- Priority: US12/983,527 20110103
- Main IPC: G02B26/00
- IPC: G02B26/00 ; G01B11/14 ; G09G3/34 ; B81C99/00
Abstract:
This disclosure provides systems, methods and apparatus, including computer programs encoded on computer storage media, for measuring a distance. In one aspect, the method includes actuating or releasing an interferometric modulator having a first surface and a second surface and measuring a distance between the first and second surfaces at a plurality of times during the actuation or release. In another aspect, the method includes illuminating, with a first laser beam having a first wavelength and with a second laser beam having a second wavelength different from the first wavelength, an interferometric modulator having a distance between a first surface which is at least partially reflective and a second surface which is at least partially absorptive, measuring a first intensity of the first laser beam modulated by the interferometric modulator and a second intensity of the second laser beam modulated by the interferometric modulator, and determining the distance based on the measured intensities.
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