Invention Application
WO2015069524A1 VERTICAL 1T-1R MEMORY CELLS, MEMORY ARRAYS AND METHODS OF FORMING THE SAME 审中-公开
垂直1T-1R记忆细胞,记忆阵列及其形成方法

  • Patent Title: VERTICAL 1T-1R MEMORY CELLS, MEMORY ARRAYS AND METHODS OF FORMING THE SAME
  • Patent Title (中): 垂直1T-1R记忆细胞,记忆阵列及其形成方法
  • Application No.: PCT/US2014/062951
    Application Date: 2014-10-29
  • Publication No.: WO2015069524A1
    Publication Date: 2015-05-14
  • Inventor: PETTI, Christopher, J.
  • Applicant: SANDISK 3D LLC
  • Applicant Address: 951 SanDisk Drive Milpitas, CA 95035 US
  • Assignee: SANDISK 3D LLC
  • Current Assignee: SANDISK 3D LLC
  • Current Assignee Address: 951 SanDisk Drive Milpitas, CA 95035 US
  • Agency: MAGEN, Burt
  • Priority: US14/075,010 20131108
  • Main IPC: H01L27/24
  • IPC: H01L27/24 H01L45/00
VERTICAL 1T-1R MEMORY CELLS, MEMORY ARRAYS AND METHODS OF FORMING THE SAME
Abstract:
Vertical 1 T-l R memory cells, memory arrays of vertical 1 T-1 R memory calls, and methods of forming such memory cells and memory arrays are described. The memory cells each include a vertical transistor (T) and a resistivity-switching element (R) coupled in series with and disposed above or below the vertical transistor. The vertical transistor includes a controlling electrode (G) coupled to a word line (WL) that is above or below the vertical transistor. The controlling electrode is disposed on a sidewall of the vertical transistor. Each vertical transistor (T) includes a first terminal coupled to a bit line (BL), a second terminal comprising the controlling electrode (G) coupled to a word line (WL), and a third terminal coupled to the resistivity-switching element (R).
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