Invention Application
WO2015069524A1 VERTICAL 1T-1R MEMORY CELLS, MEMORY ARRAYS AND METHODS OF FORMING THE SAME
审中-公开
垂直1T-1R记忆细胞,记忆阵列及其形成方法
- Patent Title: VERTICAL 1T-1R MEMORY CELLS, MEMORY ARRAYS AND METHODS OF FORMING THE SAME
- Patent Title (中): 垂直1T-1R记忆细胞,记忆阵列及其形成方法
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Application No.: PCT/US2014/062951Application Date: 2014-10-29
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Publication No.: WO2015069524A1Publication Date: 2015-05-14
- Inventor: PETTI, Christopher, J.
- Applicant: SANDISK 3D LLC
- Applicant Address: 951 SanDisk Drive Milpitas, CA 95035 US
- Assignee: SANDISK 3D LLC
- Current Assignee: SANDISK 3D LLC
- Current Assignee Address: 951 SanDisk Drive Milpitas, CA 95035 US
- Agency: MAGEN, Burt
- Priority: US14/075,010 20131108
- Main IPC: H01L27/24
- IPC: H01L27/24 ; H01L45/00
Abstract:
Vertical 1 T-l R memory cells, memory arrays of vertical 1 T-1 R memory calls, and methods of forming such memory cells and memory arrays are described. The memory cells each include a vertical transistor (T) and a resistivity-switching element (R) coupled in series with and disposed above or below the vertical transistor. The vertical transistor includes a controlling electrode (G) coupled to a word line (WL) that is above or below the vertical transistor. The controlling electrode is disposed on a sidewall of the vertical transistor. Each vertical transistor (T) includes a first terminal coupled to a bit line (BL), a second terminal comprising the controlling electrode (G) coupled to a word line (WL), and a third terminal coupled to the resistivity-switching element (R).
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