Invention Application
WO2015164220A1 SYSTEMS, METHODS AND APPARATUS FOR POST-CHEMICAL MECHANICAL PLANARIZATION SUBSTRATE CLEANING
审中-公开
后期化学机械平面化基板清洗系统,方法与装置
- Patent Title: SYSTEMS, METHODS AND APPARATUS FOR POST-CHEMICAL MECHANICAL PLANARIZATION SUBSTRATE CLEANING
- Patent Title (中): 后期化学机械平面化基板清洗系统,方法与装置
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Application No.: PCT/US2015/026552Application Date: 2015-04-17
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Publication No.: WO2015164220A1Publication Date: 2015-10-29
- Inventor: ZUNIGA, Steven, M. , BROWN, Brian, J.
- Applicant: APPLIED MATERIALS, INC
- Applicant Address: 3050 Bowers Avenue Santa Clara, CA 95054 US
- Assignee: APPLIED MATERIALS, INC
- Current Assignee: APPLIED MATERIALS, INC
- Current Assignee Address: 3050 Bowers Avenue Santa Clara, CA 95054 US
- Agency: DUGAN, Brian, M. et al.
- Priority: US14/260,210 20140423
- Main IPC: H01L21/304
- IPC: H01L21/304 ; H01L21/683
Abstract:
Embodiments of the invention include systems, methods and apparatus for pre-cleaning a substrate after chemical mechanical planarization processing. Embodiments provide a housing; a chuck assembly configured to securely hold a substrate within the housing; and a buffing pad assembly configured to rotate against the substrate while supported within the housing. The buffing pad assembly includes a buff pad, a compressible sub-pad coupled to the buff pad, and a pad holder coupled to the compressible sub-pad and a buffing motor configured to rotate the buffing pad assembly. Numerous additional aspects are disclosed.
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