Invention Application
- Patent Title: NON-CONTACTING INDUCTIVE INTERCONNECTS
- Patent Title (中): 非接触式感应互连
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Application No.: PCT/US2015/065556Application Date: 2015-12-14
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Publication No.: WO2016100211A1Publication Date: 2016-06-23
- Inventor: BURGER, Douglas C. , GATES, William , GLEW, Andrew F. , HYDE, Roderick A. , ISHIKAWA, Muriel Y. , KARE, Jordin T. , MANFERDELLI, John L. , MCWILLIAMS, Thomas M. , MUNDIE, Craig J. , MYHRVOLD, Nathan P. , SMITH, Burton , TEGREENE, Clarence T. , WEAVER, Thomas Allan , WITEK, Richard T. , WOOD, Lowell L., Jr. , WOOD, Victoria Y.H.
- Applicant: ELWHA LLC
- Applicant Address: 3150 139th Ave SE Bellevue, Washington 98005-4046 US
- Assignee: ELWHA LLC
- Current Assignee: ELWHA LLC
- Current Assignee Address: 3150 139th Ave SE Bellevue, Washington 98005-4046 US
- Agency: CHAN, Alistair K. et al.
- Priority: US14/577,735 20141219
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/12
Abstract:
A non-contacting inductive interconnect of a three-dimensional integrated circuit includes a first silicon substrate having a first inductive loop. A first layer of high permeability material is deposited on the first silicon substrate that has the first inductive loop forming a first high permeability structure. The circuit further includes a second silicon substrate having a second inductive loop. A magnetic coupling is formed between the first inductive loop and the second inductive loop. The first high permeability structure can enhance the magnetic coupling between the first inductive loop and the second inductive loop. In some embodiments, a second layer of the high permeability material is deposited on the second silicon substrate that has the second inductive loop forming a second high permeability structure. The first high permeability structure and the second high permeability structure can form a magnetic circuit coupling the first inductive loop and the second inductive loop.
Information query
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