Invention Application
WO2016146449A1 METHOD OF TEMPORARILY SUPPORTING A WAFER DURING DICING AND RFID DEVICE
审中-公开
在定时和RFID设备期间支持波形的方法
- Patent Title: METHOD OF TEMPORARILY SUPPORTING A WAFER DURING DICING AND RFID DEVICE
- Patent Title (中): 在定时和RFID设备期间支持波形的方法
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Application No.: PCT/EP2016/055004Application Date: 2016-03-09
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Publication No.: WO2016146449A1Publication Date: 2016-09-22
- Inventor: WISNIEFF, Robert, Luke , ANDRY, Paul
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION , IBM UNITED KINGDOM LIMITED
- Applicant Address: New Orchard Road Armonk, New York 10504 US
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION,IBM UNITED KINGDOM LIMITED
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION,IBM UNITED KINGDOM LIMITED
- Current Assignee Address: New Orchard Road Armonk, New York 10504 US
- Agency: FOURNIER, Kevin
- Priority: US14/658,151 20150314
- Main IPC: H01L21/683
- IPC: H01L21/683 ; H01L21/78 ; G06K19/077
Abstract:
Deep reactive ion silicon etching of a device wafer, laser-induced release of individual dies, and individual placement of the dies on flexible substrates facilitate formation of circuits having relatively large external inductors for powering devices such as RFID devices. Small flexible tabs enable die-inductor connection. The absorption properties of both an adhesive layer and an ablation layer may be employed to facilitate debonding of individual dies (22') from a glass handler (28') without damaging integrated circuits (24') associated with the dies. Die packs (36) including cavities (38) for accepting individual dies facilitate fabrication processes using dies having small dimensions.
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