Invention Application
- Patent Title: METHODS OF FORMING SENSOR INTEGRATED PACKAGES AND STRUCTURES FORMED THEREBY
- Patent Title (中): 形成传感器集成包和其结构的方法
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Application No.: PCT/US2016/019574Application Date: 2016-02-25
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Publication No.: WO2016160189A1Publication Date: 2016-10-06
- Inventor: LEE, Kyu Oh , ZHOU, Zheng , SALAMA, Islam A. , EID, Feras , OSTER, Sasha N. , KONG, Lay Wai , SOTO GONZALEZ, Javier
- Applicant: INTEL CORPORATION
- Applicant Address: 2200 Mission College Boulevard Santa Clara, California 95054 US
- Assignee: INTEL CORPORATION
- Current Assignee: INTEL CORPORATION
- Current Assignee Address: 2200 Mission College Boulevard Santa Clara, California 95054 US
- Agency: ORTIZ, Kathy J.
- Priority: US14/671,549 20150327
- Main IPC: B81B7/02
- IPC: B81B7/02
Abstract:
Methods of forming sensor integrated package devices and structures formed thereby are described. An embodiment includes providing a substrate core, wherein a first conductive trace structure and a second conductive trace structure are disposed on the substrate core, forming a cavity between the first conductive trace structure and the second conductive trace structure, and placing a magnet on a resist material disposed on a portion of each of the first and second conductive trace structures, wherein the resist material does not extend over the cavity.
Information query