Invention Application
- Patent Title: ENHANCED CONTROL OF SHUTTLE MASS MOTION IN MEMS DEVICES
- Patent Title (中): MEMS器件中穿梭质量运动的增强控制
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Application No.: PCT/US2016/026353Application Date: 2016-04-07
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Publication No.: WO2016164529A2Publication Date: 2016-10-13
- Inventor: BORCA-TASCIUC, Diana-Andra , HELLA, Mona, Mostafa , OXAAL, John
- Applicant: RENSSELAER POLYTECHNIC INSTITUTE
- Applicant Address: 110 8th Street Troy, NY 12180 US
- Assignee: RENSSELAER POLYTECHNIC INSTITUTE
- Current Assignee: RENSSELAER POLYTECHNIC INSTITUTE
- Current Assignee Address: 110 8th Street Troy, NY 12180 US
- Agency: HOFFMAN, Michael, F.
- Priority: US62/144,977 20150409; US62/222,274 20150923
- Main IPC: H01L21/027
- IPC: H01L21/027
Abstract:
A MEMS device and a method of forming the same. A disclosed method includes: providing a silicon substrate layer, a buried oxide layer and a device silicon layer; using a microfabrication process to pattern a set of device features on the device silicon layer including a shuttle mass and an anchor frame; removing the silicon substrate layer and buried oxide below the shuttle mass; placing a shadow mask on a surface of the device silicon layer, wherein the shadow mask has an microscale opening to expose at least one device feature; and forming a nanoscale stopper on a sidewall of the at least one device feature by depositing a deposition material through the opening in a controlled manner.
Information query
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