Invention Application
- Patent Title: MULTI-LEVEL SENSING CIRCUITS FOR CROSSBAR MEMORY ARRAYS
- Patent Title (中): 用于跨轨存储器阵列的多级感测电路
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Application No.: PCT/US2015/051062Application Date: 2015-09-18
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Publication No.: WO2017048293A1Publication Date: 2017-03-23
- Inventor: MURALIMANOHAR, Naveen , SHARMA, Amit S , BUCHANAN, Brent
- Applicant: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- Applicant Address: 11445 Compaq Center Drive West Houston, TX 77070 US
- Assignee: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- Current Assignee: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- Current Assignee Address: 11445 Compaq Center Drive West Houston, TX 77070 US
- Agency: WARD, Aaron S. et al.
- Main IPC: G11C13/00
- IPC: G11C13/00
Abstract:
An example device in accordance with an aspect of the present disclosure includes a plurality of first sense circuits of a first type and at least one second sense circuit of a second type. The first sense circuits are to perform first-level sensing of memory elements of a crossbar memory array based on reads that are high-confidence. The second sense circuit is to perform second-level sensing.
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