Invention Application
- Patent Title: X-RAY CALIBRATION STANDARD OBJECT
- Patent Title (中): X射线校准标准对象
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Application No.: PCT/EP2016/070794Application Date: 2016-09-19
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Publication No.: WO2017050546A1Publication Date: 2017-03-30
- Inventor: BACKLUND, Johan , WILDHEIM, Martin
- Applicant: ARCAM AB
- Applicant Address: Krokslätts Fabriker 27A 43137 Mölndal SE
- Assignee: ARCAM AB
- Current Assignee: ARCAM AB
- Current Assignee Address: Krokslätts Fabriker 27A 43137 Mölndal SE
- Priority: US62/232,135 20150924; US15/245,542 20160824
- Main IPC: B29C67/00
- IPC: B29C67/00 ; B23K15/00 ; B22F3/105 ; H01J37/304 ; H01J37/21 ; H01J37/20 ; G01T1/29
Abstract:
An X-ray standard reference object for calibrating a scanning electron beam in an additive manufacturing apparatus by measuring X-ray signals generated by scanning the electron beam onto the reference object, the reference object comprises: a lower and an upper plate being essentially in parallel and attached spaced apart from each other, the upper plate comprises a plurality of holes, wherein a predetermined hollow pattern is provided inside the holes.
Information query
