Invention Application
- Patent Title: INTEGRATED ULTRAVIOLET ANALYZER
- Patent Title (中): 集成紫外分析仪
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Application No.: PCT/KR2017/003546Application Date: 2017-03-31
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Publication No.: WO2017171464A1Publication Date: 2017-10-05
- Inventor: SIMIN, Grigory , SHUR, Michael , DOBRINSKY, Alexander
- Applicant: SEOUL VIOSYS CO., LTD. , SENSOR ELECTRONIC TECHNOLOGY, INC.
- Applicant Address: 65-16, Sandan-ro 163beon-gil, Danwon-gu, Ansan-si, Gyeonggi-do 15429 KR
- Assignee: SEOUL VIOSYS CO., LTD.,SENSOR ELECTRONIC TECHNOLOGY, INC.
- Current Assignee: SEOUL VIOSYS CO., LTD.,SENSOR ELECTRONIC TECHNOLOGY, INC.
- Current Assignee Address: 65-16, Sandan-ro 163beon-gil, Danwon-gu, Ansan-si, Gyeonggi-do 15429 KR
- Agency: AIP PATENT & LAW FIRM
- Priority: US62/316,535 20160331; US15/472,198 20170328
- Main IPC: H01L31/109
- IPC: H01L31/109 ; H01L31/09
Abstract:
An integrated ultraviolet analyzer is described. The integrated ultraviolet analyzer can include one or more ultraviolet analyzer cells, each of which includes one or more ultraviolet photodetectors and one or more solid state light sources, which are monolithically integrated. The solid state light source can be operated to emit ultraviolet light, at least some of which passes through an analyzer active gap and irradiates a light sensing surface of the ultraviolet photodetector. A medium to be evaluated can be present in the analyzer active gap and affect the ultraviolet light as it passes there through, thereby altering an effect of the ultraviolet light on a ultraviolet photodetector.
Information query
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