Invention Application
WO2017214001A1 ENGINEERING DATA COLLECTION FROM CONTROL AND INSTRUMENTATION SYSTEMS
审中-公开
工程数据收集从控制和仪器系统
- Patent Title: ENGINEERING DATA COLLECTION FROM CONTROL AND INSTRUMENTATION SYSTEMS
- Patent Title (中): 工程数据收集从控制和仪器系统
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Application No.: PCT/US2017/035865Application Date: 2017-06-04
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Publication No.: WO2017214001A1Publication Date: 2017-12-14
- Inventor: NIKHRA, Abhishek , GANAPATHI, Ramakrishnan , DUTTA, Manas , N., Kiran , R., Ravi Kumar , RAJAN, Avinash
- Applicant: HONEYWELL INTERNATIONAL INC.
- Applicant Address: Intellectual Property-Patent Services 115 Tabor Road, M/S 4D3 P. O. Box 377 Morris Plains, New Jersey 07950 US
- Assignee: HONEYWELL INTERNATIONAL INC.
- Current Assignee: HONEYWELL INTERNATIONAL INC.
- Current Assignee Address: Intellectual Property-Patent Services 115 Tabor Road, M/S 4D3 P. O. Box 377 Morris Plains, New Jersey 07950 US
- Agency: SZUCH, Colleen D.
- Priority: US15/177,792 20160609
- Main IPC: G05B19/418
- IPC: G05B19/418 ; G05B19/05 ; G05B19/414
Abstract:
A system and method of engineering configuration data (ECD) collection for an industrial facility (105) having a first control and instrumentation (C&I) system (105a) with first ECD (164a) using a first file format and a second C&I system (105b) with second ECD (164b) using a second file format, and a data collection server (120). A first data agent (110a) has collection information regarding the first C&I system and a second data agent (110b) has collection information regarding the second C&I system. The first data agent collects (410) the first ECD and the second data agent collects the second ECD. The first ECD and the second ECD are translated (422) into one common generic data format. The first ECD and the second ECD are stored (424) after being translated.
Information query
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