Invention Application
- Patent Title: METHOD AND SYSTEM FOR DETERMINING CURRENTS IN BUNDLED CONDUCTORS
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Application No.: PCT/CA2018/050576Application Date: 2018-05-15
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Publication No.: WO2018209436A1Publication Date: 2018-11-22
- Inventor: XU, Wilsun , GENG, Guangchao
- Applicant: THE GOVERNORS OF THE UNIVERSITY OF ALBERTA
- Applicant Address: Suite 4000, 10230 – Jasper Avenue Edmonton, Alberta T5J 4P6 CA
- Assignee: THE GOVERNORS OF THE UNIVERSITY OF ALBERTA
- Current Assignee: THE GOVERNORS OF THE UNIVERSITY OF ALBERTA
- Current Assignee Address: Suite 4000, 10230 – Jasper Avenue Edmonton, Alberta T5J 4P6 CA
- Agency: BRION RAFFOUL
- Priority: US62/506,129 20170515
- Main IPC: G01R35/00
- IPC: G01R35/00 ; G01R15/14 ; G01R19/25
Abstract:
Systems and methods for measuring currents in bundled conductors. A frame holding a number of sensors is used. The geometric and electrical parameters of the sensors in the frame are known or previously determined. The frame is then deployed to substantially encircle at least part of the bundled conductors. The magnetic fields produced by the current in the bundled conductors are then sensed by the sensors. The sensed magnetic fields are then turned into relevant data. The relevant data, in conjunction with the geometric and electrical properties of the sensors are then used to calculate and estimate the current in each of the bundled conductors. The parameters of the sensors may be determined during the assembly or manufacture of the frame and the sensors.
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