Invention Application
- Patent Title: SYSTEMS AND METHODS FOR ROBUST BACKGROUND CORRECTION AND/OR EMITTER LOCALIZATION FOR SUPER-RESOLUTION LOCALIZATION MICROSCOPY
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Application No.: PCT/US2019/014131Application Date: 2019-01-18
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Publication No.: WO2019152216A1Publication Date: 2019-08-08
- Inventor: MA, Hongqiang , LIU, Yang
- Applicant: UNIVERSITY OF PITTSBURGH-OF THE COMMONWEALTH SYSTEM OF HIGHER EDUCATION
- Applicant Address: 130 Thackeray Avenue 1st Floor Gardner Steel Conference Center Pittsburgh, Pennsylvania 15260 US
- Assignee: UNIVERSITY OF PITTSBURGH-OF THE COMMONWEALTH SYSTEM OF HIGHER EDUCATION
- Current Assignee: UNIVERSITY OF PITTSBURGH-OF THE COMMONWEALTH SYSTEM OF HIGHER EDUCATION
- Current Assignee Address: 130 Thackeray Avenue 1st Floor Gardner Steel Conference Center Pittsburgh, Pennsylvania 15260 US
- Agency: LEVY, Philip E.
- Priority: US62/624,932 20180201; US62/745,726 20181015
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G01N21/62 ; G01Q60/20 ; G06T7/10
Abstract:
A background correction method for a fluorescence microscopy system includes receiving a raw image stack, determining a number of temporal minimum intensity values for each pixel location from the raw image stack, and calculating an expected background value for each pixel location based on the number of temporal minimum intensity values for the pixel location. Also, an emitter localization method includes receiving a raw image stack, determining a rough position of each of a plurality of emitters within the raw image stack by employing a linear deconvolution process, and determining a precise position of each of the plurality of emitters by employing the rough position of the emitter and gradient fitting.
Information query
