Invention Application
- Patent Title: METHOD FOR DETERMINING A FOCUS ACTUATION PROFILE FOR ONE OR MORE ACTUATORS OF A LITHOGRAPHIC EXPOSURE APPARATUS
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Application No.: PCT/EP2021/087660Application Date: 2021-12-24
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Publication No.: WO2022161728A1Publication Date: 2022-08-04
- Inventor: VAN GORP, Simon, Hendrik, Celine , VAN REENEN, Stephan
- Applicant: ASML NETHERLANDS B.V.
- Applicant Address: P.O. Box 324
- Assignee: ASML NETHERLANDS B.V.
- Current Assignee: ASML NETHERLANDS B.V.
- Current Assignee Address: P.O. Box 324
- Agency: ASML NETHERLANDS B.V.
- Priority: EP21154359.0 2021-01-29
- Main IPC: G03F9/00
- IPC: G03F9/00
Abstract:
Disclosed is a method for determining a focus actuation profile for one or more actuators of a lithographic exposure apparatus in control of a lithographic exposure process for exposure of an exposure area comprising at least two topographical levels. The method comprises determining a continuous single focus actuation profile for the at least two topographical levels from an objective function comprising a per-level component operable to optimize a focus metric per topographical level for each of said at least two topographical levels.
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