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1.发明公开
公开(公告)号：EP2542858A1
公开(公告)日：2013-01-09
申请号：EP11713013.8
申请日：2011-03-04
IPC分类号： G01B21/04
摘要： An error correction method for coordinate positioning apparatus is described. The method comprises (i) taking a first data set comprising one or more first data values, each first data value describing a position on the surface of a first object, (ii) taking a second data set comprising one or more second data values, each second data value describing a position on the surface of the first object, and (iii) calculating an error map comprising one or more error values, each error value describing a positional difference between the surface as described by the first data set and the surface as described by the second data set. The surface normal of the first object is known at each position described by each first data value and step (iii) comprises calculating each error value by determining the positional difference substantially in the direction of the known surface normal.
摘要翻译： 描述了用于坐标定位设备的错误校正方法。 该方法包括（i）获取包括一个或多个第一数据值的第一数据集，每个第一数据值描述第一对象表面上的位置，（ii）获取包括一个或多个第二数据值的第二数据集， 每个第二数据值描述第一对象的表面上的位置，以及（iii）计算包括一个或多个误差值的误差映射，每个误差值描述如第一数据集所描述的表面与表面之间的位置差异 如第二组数据所述。 第一物体的表面法线在由每个第一数据值描述的每个位置处是已知的，并且步骤（in）包括通过基本上在已知表面法线的方向上确定位置差来计算每个误差值。 使用在步骤（iii）中计算出的误差图对第一对象或与第一对象名义相同的对象执行处理或测量操作，其中表面上的位置被校正。
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公开(公告)号：EP3192611A1
公开(公告)日：2017-07-19
申请号：EP16150852.8
申请日：2016-01-12
IPC分类号： B23Q17/22 , G01B21/04 , G01B3/22 , G05B19/401
CPC分类号： B23Q17/2233 , G01B21/042 , G05B19/401
摘要： A calibration device (30) for a machine tool is described that includes a base (36) attachable to a machine tool and a calibration artefact (32), such as a sphere of known radius. A deflection mechanism attaches the calibration artefact to the base and allows movement of the calibration artefact (32) relative to the base (36) when an external force is applied to the calibration artefact (32). The deflection mechanism also maintains the calibration artefact (32) in a defined rest position relative to the base (36) in the absence of an applied external force. A sensor (46) is provided for sensing the extent of movement of the calibration artefact (32) relative to the base (36). A method of using the device (30) with a reference tool to accurately determine a position of a calibration artefact (32) is also described.
摘要翻译： 描述了用于机床的校准装置（30），其包括可附接到机床的基座（36）和校准制品（32），例如已知半径的球体。 偏转机构将校准制品附接到基座并且允许校准制品（32）相对于基座（36）在外力施加到校准制品（32）时移动。 偏转机构还在没有施加外力的情况下将校准制品（32）保持在相对于基座（36）的限定的静止位置中。 提供传感器（46）用于感测校准制品（32）相对于基座（36）的移动程度。 还描述了使用具有参考工具的设备（30）来准确地确定校准制品（32）的位置的方法。
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公开(公告)号：EP3402628A1
公开(公告)日：2018-11-21
申请号：EP17700094.0
申请日：2017-01-10
IPC分类号： B23Q17/22 , G01B21/04 , G01B3/22 , G05B19/401
CPC分类号： B23Q17/2233 , G01B21/042 , G05B19/401 , G05B2219/37619
摘要： A calibration device (30) for a machine tool is described that includes a base (36) attachable to a machine tool and a calibration artefact (32), such as a sphere of known radius. A deflection mechanism attaches the calibration artefact to the base and allows movement of the calibration artefact (32) relative to the base (36) when an external force is applied to the calibration artefact (32). The deflection mechanism also maintains the calibration artefact (32) in a defined rest position relative to the base (36) in the absence of an applied external force. A sensor (46) is provided for sensing the extent of movement of the calibration artefact (32) relative to the base (36). A method of using the device (30) with a reference tool to accurately determine a position of a calibration artefact (32) is also described.
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