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    APPARATUS FOR SIMULTANEOUSLY ANALYZING MULTIPLE IONS WITH AN ELECTROSTATIC LINEAR ION TRAP
    12.
    发明公开
    APPARATUS FOR SIMULTANEOUSLY ANALYZING MULTIPLE IONS WITH AN ELECTROSTATIC LINEAR ION TRAP 审中-公开

    公开(公告)号：EP4443473A2

    公开(公告)日：2024-10-09

    申请号：EP24195623.4

    申请日：2019-01-11

    申请人： The Trustees of Indiana University

    发明人： JARROLD, Martin F. ,  BOTAMANENKO, Daniel

    IPC分类号： H01J49/42

    CPC分类号： H01J49/027 ,  H01J49/4245 ,  H01J49/426

    摘要： A charge detection mass spectrometer may include an ion source, an electrostatic linear ion trap (ELIT) including a charge detection cylinder disposed between a pair of coaxially aligned ion mirrors, means for selectively establishing electric fields within the ion mirrors configured to cause the trapped ions in the ELIT to oscillate back and forth between the ion mirrors each time passing through the charge detection cylinder, and means for controlling a trajectory of the beam of ions entering the ELIT to cause the subsequently trapped ions to oscillate with different planar ion oscillation trajectories angularly offset from one another about the longitudinal axis with each extending along and crossing the longitudinal axis in each of the ion mirrors or with different cylindrical ion oscillation trajectories radially offset from one another about the longitudinal axis to form nested cylindrical trajectories each extending along the longitudinal axis.