公开(公告)号：EP1296145B1

公开(公告)日：2007-04-11

申请号：EP01943857.1

申请日：2001-06-28

Applicant: NHK SPRING CO., LTD.

Inventor： KAZAMA, Toshio

IPC: G01R1/067 ,  H01L21/66 ,  H01R13/24 ,  H01R33/76

CPC classification number: G01R1/06722 ,  G01R1/0466 ,  G01R1/0483 ,  G01R1/06716 ,  H01R12/52 ,  H01R13/2421 ,  H05K7/1069

Abstract: A conductive contact which is used for an apparatus for testing semiconductor devices and circuit boards having solder ball- or solder-deposited terminals, or for the sockets of semiconductor devices, wherein at least a conductive contact portion of the conductive contact is provided with a layer consisting of a solder-incompatible, highly conductive material so as to reduce the deposit of solder to the contact portion from an element to be contacted and significantly increase the number of contacts up to a cleaning time due to an increase in the deposited amount of solder, thereby improving a rate of operation of an inspection line and prompting a reduction in maintenance costs.

公开(公告)号：EP1290454B1

公开(公告)日：2007-02-28

申请号：EP01938697.8

申请日：2001-06-15

Applicant: NHK SPRING CO., LTD.

Inventor： KAZAMA, Toshio

IPC: G01R1/067

CPC classification number: G01R1/06722 ,  G01R1/06772

Abstract: In order for a conduction path to have a reduced number of sliding portions for conduction, without increase in inductance nor resistance, thereby permitting an enhanced accuracy of inspection, a pair of plungers (3, 4) biased in opposite directions by a coil spring (2), to be electrically connected to a wiring plate (10), have electrical connections in which, in a tubular portion (15) as a tight wound spiral portion (15a) fixed on one plunger (4) to allow linear flow of electrical signal, the other plunger (3) is brought into slidable contact.

Abstract translation: 为了使传导路径具有减少数量的用于传导的滑动部分，而不增加电感或电阻，从而允许提高检查精度，一对柱塞（3,4）由螺旋弹簧（ 2）与布线板（10）电连接，具有电连接，在该连接中，在作为固定在一个柱塞（4）上的紧密卷绕螺旋部分（15a）的管状部分（15）中，允许线性电流 信号，另一个柱塞（3）进入滑动接触。