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公开(公告)号:EP0552604B1
公开(公告)日:1997-04-09
申请号:EP93100102.8
申请日:1993-01-07
Applicant: THE PERKIN-ELMER CORPORATION
Inventor: Ganz, Alan M. , Tracy, David H.
CPC classification number: G01J1/08 , G01N21/274
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22.
公开(公告)号:EP0613598A4
公开(公告)日:1994-07-19
申请号:EP92923250
申请日:1992-10-21
Applicant: BIO RAD LABORATORIES
Inventor: CURBELO RAUL
CPC classification number: G01N21/274 , G01J3/453 , G01J2001/086
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23.Procédé pour étalonner un instrument d'optique et ses applications 失效
Title translation: 一种用于光学仪器的校准方法,以及它们的应用。公开(公告)号:EP0434567B1
公开(公告)日:1994-07-13
申请号:EP90403717.3
申请日:1990-12-20
Applicant: CENTRE NATIONAL D'ETUDES SPATIALES
Inventor: Deshayes, Jean-Pierre
IPC: G01J1/08
CPC classification number: G01J1/08
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公开(公告)号:EP3615901B1
公开(公告)日:2025-05-21
申请号:EP18802192.7
申请日:2018-05-14
Inventor: PACALA, Angus , FRICHTL, Mark , YOUNGE, Eric , SHU, Marvin
IPC: G01J1/02 , G01J1/08 , G01J1/44 , G01S7/481 , G01S7/4863 , G01S7/4865 , G01S17/08 , G01S17/10 , G01S17/42 , G01S17/89 , G01S17/931 , G02B27/46 , H01L27/144 , H01L27/146 , H01L31/02 , H01L31/0216 , H01L31/0232 , H01L31/107
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公开(公告)号:EP4548056A1
公开(公告)日:2025-05-07
申请号:EP23734682.0
申请日:2023-06-28
Applicant: Admesy B.V.
Inventor: BOUTEN, Ruud Martin Jozef
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公开(公告)号:EP3551986B1
公开(公告)日:2025-01-22
申请号:EP17879336.0
申请日:2017-12-07
Inventor: KAWAMATA, Nobuhiro , KASAI, Toshihiro , SASANAMI, Hiromitsu , MORI, Shigeki
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公开(公告)号:EP3824810B1
公开(公告)日:2024-05-15
申请号:EP20217910.7
申请日:2018-06-13
IPC: A61B5/1455 , G01J1/08 , G01J1/46 , G01J1/02
CPC classification number: A61B2560/020920130101 , A61B5/14552 , A61B5/6826 , G01J1/08 , G01J1/46 , G01J1/0228
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公开(公告)号:EP3421953B1
公开(公告)日:2021-01-06
申请号:EP16921303.0
申请日:2016-11-25
Inventor: ZHAO, Facai , SUN, Quanshe , WANG, Shaoshui , WANG, Guoqquan , ZHENG, Xiangliang , HAN, Zhong
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公开(公告)号:EP3615901A1
公开(公告)日:2020-03-04
申请号:EP18802192.7
申请日:2018-05-14
Applicant: Ouster, Inc.
Inventor: PACALA, Angus , FRICHTL, Mark , YOUNGE, Eric , SHU, Marvin
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