公开(公告)号：EP0834725A3

公开(公告)日：1999-06-02

申请号：EP97117174.9

申请日：1997-10-02

Applicant: The Perkin-Elmer Corporation

Inventor： Tracy, David H. ,  Ganz, Alan M. ,  Wang, Yongdong ,  Huppler, David A. ,  Ivaldi, Juan C. , 

IPC: G01J3/28 ,  G01N21/27

CPC classification number: G01J3/28 ,  G01J3/2803 ,  G01J3/457 ,  G01J2003/2866

Abstract: A spectrometric instrument includes a detector with detecting subarrays on small portions of the surface. Spectral data are acquired for selected subarrays at a first time for a drift standard, and compared to a zero position to obtain first offset data. Data are acquired similarly at a second time to obtain second offset data. The offset data are utilized to obtain a spectral shift for any subarray position at any selected time. The shift is applied to a matrix model used for converting test data to compositional information. Archive data for the model is obtained in the foregoing manner, using slit scanning in the instrument to achieve sub-increments smaller than the detector pixel size, with a procedure to assure that there is an integral number of scanning steps across one pixel. The drift standard may be chemical analytes, or an optical interference element producing fringes related to spectral positions in each subarray. A procedure is used to identify the fringe peaks to spectral position, with temperature correction.

Abstract translation: 光谱仪器包括一个检测器，在表面的小部分上检测子阵列。 第一次为漂移标准采集选定子阵列的光谱数据，并与零位相比较以获得第一偏移数据。 第二次类似地获取数据以获得第二偏移数据。 利用偏移数据来获得任何选定时间的任何子阵列位置的频谱偏移。 该转换应用于用于将测试数据转换为组成信息的矩阵模型。 以前述方式获得模型的档案数据，使用仪器中的狭缝扫描以获得小于检测器像素尺寸的子增量，其中程序确保在一个像素上存在整数个扫描步骤。 漂移标准可以是化学分析物，或者是产生与每个子阵列中的光谱位置有关的条纹的光学干涉元件。 通过温度校正，使用一个程序来识别边缘峰值到光谱位置。

公开(公告)号：EP0834725A2

公开(公告)日：1998-04-08

申请号：EP97117174.9

申请日：1997-10-02

Applicant: The Perkin-Elmer Corporation

Inventor： Tracy, David H. ,  Ganz, Alan M. ,  Wang, Yongdong ,  Huppler, David A. ,  Ivaldi, Juan C. , 

IPC: G01J3/28 ,  G01N21/27

CPC classification number: G01J3/28 ,  G01J3/2803 ,  G01J3/457 ,  G01J2003/2866

Abstract: A spectrometric instrument includes a detector with detecting subarrays on small portions of the surface. Spectral data are acquired for selected subarrays at a first time for a drift standard, and compared to a zero position to obtain first offset data. Data are acquired similarly at a second time to obtain second offset data. The offset data are utilized to obtain a spectral shift for any subarray position at any selected time. The shift is applied to a matrix model used for converting test data to compositional information. Archive data for the model is obtained in the foregoing manner, using slit scanning in the instrument to achieve sub-increments smaller than the detector pixel size, with a procedure to assure that there is an integral number of scanning steps across one pixel. The drift standard may be chemical analytes, or an optical interference element producing fringes related to spectral positions in each subarray. A procedure is used to identify the fringe peaks to spectral position, with temperature correction.

Abstract translation: 光谱仪器包括一个检测器，其表面的小部分具有检测到的子阵列。 针对漂移标准在第一时间针对选定的子阵列采集光谱数据，并与零位置进行比较以获得第一偏移数据。 在第二时间类似地获取数据以获得第二偏移数据。 偏移数据用于在任何选定的时间获得任何子阵列位置的光谱偏移。 该转移被应用于用于将测试数据转换成组合信息的矩阵模型。 以上述方式获得模型的归档数据，使用仪器中的狭缝扫描来实现小于检测器像素尺寸的次增量，以确保跨一个像素存在整数个扫描步骤的程序。 漂移标准可以是化学分析物，或者产生与每个子阵列中的光谱位置相关的条纹的光学干涉元件。 使用一个程序来识别光谱位置的边缘峰值，并进行温度校正。

公开(公告)号：EP0658751B1

公开(公告)日：1998-08-05

申请号：EP94119876.4

申请日：1994-12-15

Applicant: THE PERKIN-ELMER CORPORATION

Inventor： Cahill, Jerry E. ,  Ganz, Alan M. ,  Saviano, Paul ,  Tracy, David ,  Wang, Yongdon

IPC: G01J3/28 ,  G01N21/27

CPC classification number: G01J3/28 ,  G01J2003/2866

公开(公告)号：EP0849575A2

公开(公告)日：1998-06-24

申请号：EP97122558.6

申请日：1997-12-19

Applicant: The Perkin-Elmer Corporation

Inventor： Ganz, Alan M. ,  Wang, Yongdong ,  Tracy, David H. ,  Hoult, Robert A. ,  Cahill, Jerry E. ,  Huppler, David A.

IPC: G01J3/00

CPC classification number: G01J3/04 ,  G01J3/45 ,  G01J2003/2866

Abstract: Standardization is achieved for FTIR spectrometric instruments that effect an intrinsic distortion in spectral information, the distortion being associated with an aperture size. An idealized function of spectral line shape is specified. With a small calibration aperture, spectral data is obtained for a basic sample having known "true" spectral data, and standard spectral data also is obtained for a standard sample. With a larger, normal sized aperture, standard spectral data is obtained again for the calibration sample. A transformation factor, that is a function of this data and the standardized function, is applied to spectral data for test samples to effect standardized information. In another embodiment, the standard sample has known true spectral data, and the basic sample is omitted. In either case, the transformation factor is applied to the sample data in logarithm form, the antilogarithm of the result effects the standardized information.

Abstract translation: 对于影响光谱信息中的固有失真的FTIR光谱仪器实现标准化，失真与孔径尺寸相关联。 规定了光谱线形状的理想化功能。 使用小的校准孔径，获得具有已知“真实”光谱数据的基本样本的光谱数据，并且还为标准样品获得标准光谱数据。 对于较大的正常尺寸的孔径，再次为校准样品获得标准光谱数据。 作为该数据和标准化功能的函数的变换因子被应用于测试样本的光谱数据以实现标准化信息。 在另一个实施例中，标准样品具有已知的真实光谱数据，并省略了基本样品。 在任一情况下，转换因子以对数形式应用于样本数据，结果的反对数效应影响标准化信息。

公开(公告)号：EP0560006B1

公开(公告)日：1997-12-10

申请号：EP93100106.9

申请日：1993-01-07

Applicant: THE PERKIN-ELMER CORPORATION

Inventor： Ganz, Alan M. ,  Tracy, David H. ,  Hoult, Robert A.

IPC: G01J3/28

CPC classification number: G01J3/2803 ,  G01J3/28 ,  G01J2003/2866

公开(公告)号：EP0560006A3

公开(公告)日：1993-12-15

申请号：EP93100106.9

申请日：1993-01-07

Applicant: THE PERKIN-ELMER CORPORATION

Inventor： Ganz, Alan M. ,  Tracy, David H. ,  Hoult, Robert A.

IPC: G01J3/28

CPC classification number: G01J3/2803 ,  G01J3/28 ,  G01J2003/2866

Abstract: A spectrometric instrument which exhibits an intrinsic profile for a sharp spectral line produces profile data for narrow spectral lines. The spectral lines are effected with a high finesse etalon of gold coated polymer. A transformation filter is computed for transforming the profile data to a gaussian profile. A wavelength calibration is combined with the filter to effect a correction matrix which is applied to sample data to generate calibrated standardized data. Iteratively a correction matrix is applied to calibration data to generate standardized calibration data which is utilized for the wavelength calibration. Calibration is effected with an optical standard, an interference etalon and a fringe formula. Etalon effective thickness is first estimated and then precisely determined so that fringe peaks calibrate wavelength.

公开(公告)号：EP0552604A1

公开(公告)日：1993-07-28

申请号：EP93100102.8

申请日：1993-01-07

Applicant: THE PERKIN-ELMER CORPORATION

Inventor： Ganz, Alan M. ,  Tracy, David H.

IPC: G01N21/27 ,  G01J1/08

CPC classification number: G01J1/08 ,  G01N21/274

Abstract: To calibrate a photodetector, a rotating disk with a slot is disposed in a light beam with decreasing speed from a defined maximum rotational speed to a defined minimum speed, while magnitudes and times of signals are read out and stored. Vernier pairs of signals occur in adjacent readout intervals, and non-vernier signals exclude the verniers. Readout times for verniers are used to estimate a preliminary function of rotations versus time. From the function are estimated an occurrence time for each pair and period of disk rotation at the time. Vernier fraction is the ratio of one signal in the pair to the sum of the pair. A time offset is the product of vernier fraction, slot fraction of the disk and the estimated period. Occurrence times corrected with the time offset are utilized to fit a corrected function of disk rotations versus time. Points of time for the non-vernier signals are determined from the corrected function, each point corresponding to disk rotations to a corresponding non-vernier signal. These points of time are employed with corresponding signals for linearly calibrating the photodetector.

Abstract translation: 为了校准光电检测器，具有狭槽的旋转盘以从限定的最大转速降低到限定的最小速度的光束布置，同时读出并存储信号的幅度和时间。 游标对信号发生在相邻的读出间隔中，非游标信号排除游标。 用于游标的读数时间用于估计旋转与时间的初步功能。 从该功能估计每一对的发生时间和当时磁盘旋转周期。 游标分数是该对中的一个信号与该对之和的比率。 时间偏移是游标分数，磁盘的时隙分数和估计周期的乘积。 使用时间偏移校正的发生次数用于适应盘旋转与时间的校正功能。 从校正函数确定非游标信号的时间点，每个点对应于盘旋转到相应的非游标信号。 这些时间点用于线性校准光电检测器的相应信号。

公开(公告)号：EP0834725B1

公开(公告)日：2004-06-02

申请号：EP97117174.9

申请日：1997-10-02

Applicant: The Perkin-Elmer Corporation

Inventor： Tracy, David H. ,  Ganz, Alan M. ,  Wang, Yongdong ,  Huppler, David A. ,  Ivaldi, Juan C. , 

IPC: G01J3/28 ,  G01N21/27

CPC classification number: G01J3/28 ,  G01J3/2803 ,  G01J3/457 ,  G01J2003/2866

公开(公告)号：EP0658751A3

公开(公告)日：1995-10-25

申请号：EP94119876.4

申请日：1994-12-15

Applicant: THE PERKIN-ELMER CORPORATION

Inventor： Cahill, Jerry E. ,  Ganz, Alan M. ,  Saviano, Paul ,  Tracy, David ,  Wang, Yongdon

IPC: G01J3/28 ,  G01N21/27

CPC classification number: G01J3/28 ,  G01J2003/2866

Abstract: For correction of spectra for stray radiation in a spectrometric instrument, spectral patterns are obtained for monochromatic radiation at a plurality of calibration wavelengths directed into the wavelength analyzer of the instrument. The peak profile in each pattern is replaced and the resulting data are interpolated to the ordered wavelengths of the instrument and normalized to effect stray proportions. Spectral sample data for each ordered wavelength are multiplied by stray proportions to effect stray portions identified to the ordered wavelength and respectfully to the wavelength increments across the spectral range. The stray portions for each ordered wavelength are summed and the total is subtracted from the spectral data for the ordered wavelength to effect data corrected for stray.

公开(公告)号：EP0560006A2

公开(公告)日：1993-09-15

申请号：EP93100106.9

申请日：1993-01-07

Applicant: THE PERKIN-ELMER CORPORATION

Inventor： Ganz, Alan M. ,  Tracy, David H. ,  Hoult, Robert A.

IPC: G01J3/28

CPC classification number: G01J3/2803 ,  G01J3/28 ,  G01J2003/2866

Abstract: A spectrometric instrument which exhibits an intrinsic profile for a sharp spectral line produces profile data for narrow spectral lines. The spectral lines are effected with a high finesse etalon of gold coated polymer. A transformation filter is computed for transforming the profile data to a gaussian profile. A wavelength calibration is combined with the filter to effect a correction matrix which is applied to sample data to generate calibrated standardized data. Iteratively a correction matrix is applied to calibration data to generate standardized calibration data which is utilized for the wavelength calibration. Calibration is effected with an optical standard, an interference etalon and a fringe formula. Etalon effective thickness is first estimated and then precisely determined so that fringe peaks calibrate wavelength.

Abstract translation: 显示尖谱线固有分布的光谱仪器产生窄谱线的分布数据。 谱线是用金涂层聚合物的高精度标准具进行的。 计算转换滤波器以将轮廓数据转换为高斯轮廓。 波长校准与滤波器组合以产生校正矩阵，校正矩阵应用于采样数据以生成经校准的标准化数据。 迭代地将校正矩阵应用于校准数据以生成用于波长校准的标准化校准数据。 使用光学标准，干涉标准具和条纹公式进行校准。 首先估计标准具有效厚度，然后精确确定边缘峰值来校准波长。