COUNTER ELECTRODE FOR ELECTROCHROMIC DEVICES
    22.
    发明公开

    公开(公告)号:EP4258048A2

    公开(公告)日:2023-10-11

    申请号:EP23193972.9

    申请日:2016-07-07

    申请人: View, Inc.

    IPC分类号: G02F1/1524

    摘要: The embodiments herein relate to electrochromic stacks, electrochromic devices, and methods and apparatus for making such stacks and devices. In various embodiments, an anodically coloring layer in an electrochromic stack or device is fabricated to include a heterogeneous structure, for example a heterogeneous composition and/or morphology. Such heterogeneous anodically coloring layers can be used to better tune the properties of a device.

    DEFECT-MITIGATION LAYERS IN ELECTROCHROMIC DEVICES

    公开(公告)号:EP3929656A1

    公开(公告)日:2021-12-29

    申请号:EP21184089.7

    申请日:2014-02-07

    申请人: View, Inc.

    IPC分类号: G02F1/1524

    摘要: Electrochromic devices and methods may employ the addition of a defect-mitigating insulating layer which prevents electronically conducting layers and/or electrochromically active layers from contacting layers of the opposite polarity and creating a short circuit in regions where defects form. In some embodiments, an encapsulating layer is provided to encapsulate particles and prevent them from ejecting from the device stack and risking a short circuit when subsequent layers are deposited. The insulating layer may have an electronic resistivity of between about 1 and 108 Ohm-cm. In some embodiments, the insulating layer contains one or more of the following metal oxides: aluminum oxide, zinc oxide, tin oxide, silicon aluminum oxide, cerium oxide, tungsten oxide, nickel tungsten oxide, and oxidized indium tin oxide. Carbides, nitrides, oxynitrides, and oxycarbides may also be used.

    PARTICLE REMOVAL DURING FABRICATION OF ELECTROCHROMIC DEVICES

    公开(公告)号:EP3761112A1

    公开(公告)日:2021-01-06

    申请号:EP20193204.3

    申请日:2015-04-16

    申请人: View, Inc.

    发明人: ROZBICKI, Robert

    IPC分类号: G02F1/163 G02F1/1524

    摘要: Electrochromic devices are fabricated using a particle removal operation that reduces the occurrence of electronically conducting layers and/or electrochromically active layers from contacting layers of the opposite polarity and creating a short circuit in regions where defects form. The particle removal operation is not a lithiation operation. Wherein the lithiation operation is performed immediately after performing the particle-removal operation.