MASK, PHOTOLITHOGRAPHIC DEVICE, MANUFACTURING METHOD FOR MASK, AND MASK-BASED PHOTOLITHOGRAPHY METHOD

    公开(公告)号:EP4509918A1

    公开(公告)日:2025-02-19

    申请号:EP22936720.6

    申请日:2022-10-19

    Inventor: LI, Xijun

    Abstract: A mask, a lithographing apparatus, a method of manufacturing a mask and a lithographing method based on a mask. The mask includes: a substrate (110) configured to be transmissive to an exposure beam (920) for lithography, wherein the exposure beam (920) is in a first frequency band; and a photochromic layer (120) provided on one side of the substrate (110) and comprising a photochromic material, the photochromic layer being configured to generate a corresponding mask pattern under illumination of a modulation beam (930) with a spatial structure, wherein the photochromic material is in a non-light-transmitting state or a light-transmitting state to the exposure beam based on whether the photochromic material is illuminated by modulation light in the modulation beam (930), and the modulation beam (930)is in a second frequency band separated from the first frequency band.

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