公开(公告)号：EP0491435A2

公开(公告)日：1992-06-24

申请号：EP91203267.9

申请日：1991-12-12

Applicant: Philips Electronics N.V.

Inventor： Bertram, Albert Ralph Johan ,  Coenders, Johannes Wilhelmus ,  Span, Francis Johannes

IPC: G01J3/453 ,  G01J3/02 ,  G02B7/182 ,  G12B5/00 ,  G01M11/04

CPC classification number: G02B7/1825 ,  G01J3/453 ,  G12B5/00

Abstract: An interferometer which may be used in a Fourier transform infra red spectrometer comprises a beam splitter (10), first and second fixed mirrors (18,26), path length variation means (20), and a folding mirror (16). The optical components are mounted on a casting (8) such that the beam splitter (10) and folding mirror (16) are arranged parallel to each other and the fixed mirrors (18,26) are attached to a single face of the casting in the same plane. The path length variation means (20) comprises two parallel opposed mirrors (22,24) which are rotatable to vary the length of the optical path between the beam splitter (10) and the fixed mirror (26).

Abstract translation: 可用于傅里叶变换红外光谱仪的干涉仪包括分束器（10），第一和第二固定镜（18,26），路径长度变化装置（20）和折叠镜（16）。 光学部件安装在铸件（8）上，使得分束器（10）和折叠镜（16）彼此平行地布置，并且固定镜（18,26）附接到铸件的单面 同一架飞机。 路径长度变化装置（20）包括两个平行的相对的反射镜（22,24），其可旋转以改变分束器（10）和固定镜（26）之间的光路的长度。

公开(公告)号：EP0478785A1

公开(公告)日：1992-04-08

申请号：EP91905899.0

申请日：1991-03-26

Applicant: ANRITSU CORPORATION ,  NIPPON TELEGRAPH AND TELEPHONE CORPORATION

Inventor： TAMURA, Youichi, B-201, Yatoh Haitsu ,  GOTO, Hiroshi, 661-1-401, Ishida ,  TSUKAMOTO, Takeshi, C-105, 882-1, Tsurumaki ,  ICHIHASHI, Yasutaka, 3-20-1, Hinode-cho ,  IMAI, Takamasa, 2-1-3-2-303, Hayashi

IPC: G01J9/02

CPC classification number: G01J3/453 ,  G01J9/0246

Abstract: The wavelength (λ) of light to be measured is determined in accordance with the formula λ = Ds/N from the number (N) of interference fringes having predetermined repeating waveforms that occur when the optical path length is changed by the quantity Ds by moving continuously a movable portion (7) of an interference spectrometer portion (1) of a wavelength measuring apparatus at a constant speed. A wave number counter (13) counts the number of specific points in each period of the interference fringes entirely from a predetermined measuring start point to a predetermined measuring finish point to obtain wave number data (Na). A reference pulse generation portion (21) generates reference pulses having a higher frequency than the repeating waveforms of the interference fringes. Detection portions (22a, 23a) detect the first number of the reference pulses existing in one period of the interference fringes, the second number of the reference pulses existing inside the period from the measuring start point till the first specific point of the interference fringes in succession to the measuring start point and the third number of the reference pulses existing inside the period from the final specific point of the interference fringes to the measuring finish point. A calculation portion (26) corrects the wave number data (Na) to wave number data (N A ) inclusive of fraction values using the first, second and third numbers, and measures highly precisely the wavelength of light to be measured in accordance with the following equation: λ = Ds/N A .

Abstract translation: 当光路长度由量Ds的改变，以通过移动光的要测量的波长（波长）是确定性的开采与式的λ= Ds的/ N从干涉条纹的条数（N）雅舞蹈具有预定重复波形确实发生 连续干扰光谱仪中的部分的可动部（7）（1）以恒定速度的波长测量装置的。 波数计数器（13）完全从预定的测量开始点到结束一个预定的测量点，以获得波数数据（Na）的计算特定点的干涉条纹的各周期的数目。 参考脉冲生成部具有比所述干涉条纹的重复波形更高的频率（21）基因率参考脉冲。 检测部（22A，23A）检测存在于干涉条纹的一个周期的基准脉冲的第一数目，现有从测量的期间内的基准脉冲的第二数目的启动点，直到在干涉条纹的所述第一特定点 继承到测量点并启动第三数目从现有的干涉条纹到测量点结束的最终特定点的期间内的基准脉冲。 的计算部分（26）校正的波数数据（Na）的波数数据（NA）包括使用所述第一，第二和第三个数字分数值，并且测量高精度的光的波长在雅舞蹈来测量具有以下 方程：波长= DS / NA。

公开(公告)号：EP0435327A3

公开(公告)日：1992-01-29

申请号：EP90125695.8

申请日：1990-12-28

Applicant: SHIMADZU CORPORATION

Inventor： Tsuji, Fumio, c/o Shimadzu Corp. ,  Yoshikawa, Osamu, c/o Shimadzu Corp.

IPC: G01J3/453 ,  G01B9/02 ,  G01J3/45

CPC classification number: G01J3/4535 ,  G01J3/453 ,  G01N2021/3595

Abstract: There is disclosed an interference spectrophotometer which collects data while monitoring the position of a movable mirror by providing quadrature control to accurately perform coherent addition of data. The spectrophotometer includes a main interferometer (100), a control interferometer (12), a sliding controller (20) controlling movement of the movable mirror (6), an A/D converter (47) converting analog data obtained by the main interferometer into digital form, a register (106) for holding data obtained by one scan of the movable mirror, a memory (108) for accumulating data obtained by numerous scans of the movable mirror, an up/down counter (82) receiving the output signals from two detectors included in the control interferometer, and a decision part (110). When the counter's value varies, the counter causes the A/D converter to perform its A/D conversion. Then, the decision part checks the counter's value after the A/D conversion. If this value differs from the count value obtained prior to the A/D conversion, the data held in the register is discarded.

公开(公告)号：EP0436752A1

公开(公告)日：1991-07-17

申请号：EP90100310.3

申请日：1990-01-08

Applicant: ADVANTEST CORPORATION

Inventor： Niki, Shoji ,  Pawlik, Jon R.

IPC: G01J3/453

CPC classification number: G01J3/453

Abstract: In a device which extracts an optical interference signal (SA) for analyzing the spectrum of light to be measured, the light (11) to be measured is incident to an optical interferometer (20) capable of sweeping an optical path difference and interference light output therefrom is converted into an electric signal to obtain an optical in­terference signal (SA). On the other hand, the optical po­wer of the light (11) to be measured is extracted to create an optical power signal, which is provided to a divider, wherein the optical interference signal is divided by the optical power signal to obtain a noise-free optical inter­ference signal.

Abstract translation: 在提取用于分析被测光的光谱的光干涉信号（SA）的装置中，待测光（11）入射到能够扫描光路差和干涉光输出的光干涉仪（20） 从而将其转换成电信号以获得光学干涉信号（SA）。 另一方面，提取要测量的光（11）的光功率以产生提供给分频器的光功率信号，其中光干涉信号被光功率信号除以获得噪声 - 自由光干扰信号。

公开(公告)号：EP0435327A2

公开(公告)日：1991-07-03

申请号：EP90125695.8

申请日：1990-12-28

Applicant: SHIMADZU CORPORATION

Inventor： Tsuji, Fumio, c/o Shimadzu Corp. ,  Yoshikawa, Osamu, c/o Shimadzu Corp.

IPC: G01J3/453 ,  G01B9/02 ,  G01J3/45

CPC classification number: G01J3/4535 ,  G01J3/453 ,  G01N2021/3595

Abstract: There is disclosed an interference spectrophotometer which collects data while monitoring the position of a movable mirror by providing quadrature control to accurately perform coherent addition of data. The spectrophotometer includes a main interferometer (100), a control interferometer (12), a sliding controller (20) controlling movement of the movable mirror (6), an A/D converter (47) converting analog data obtained by the main interferometer into digital form, a register (106) for holding data obtained by one scan of the movable mirror, a memory (108) for accumulating data obtained by numerous scans of the movable mirror, an up/down counter (82) receiving the output signals from two detectors included in the control interferometer, and a decision part (110). When the counter's value varies, the counter causes the A/D converter to perform its A/D conversion. Then, the decision part checks the counter's value after the A/D conversion. If this value differs from the count value obtained prior to the A/D conversion, the data held in the register is discarded.

Abstract translation: 公开了一种干涉分光光度计，其通过提供正交控制来监视可移动镜的位置来收集数据，以准确地执行数据的相干加法。 分光光度计包括主干涉仪（100），控制干涉仪（12），控制可移动反射镜（6）的移动的滑动控制器（20），将由主干涉仪获得的模拟数据转换成 数字形式，用于保持通过可移动镜的一次扫描获得的数据的寄存器（106），用于累积通过可移动镜的大量扫描获得的数据的存储器（108），接收来自可移动镜的输出信号的上/下计数器 包括在控制干涉仪中的两个检测器和判定部件（110）。 当计数器的值变化时，计数器使A / D转换器进行A / D转换。 然后，决定部分在A / D转换后检查计数器的值。 如果该值与在A / D转换之前获得的计数值不同，则丢弃保存在寄存器中的数据。

公开(公告)号：EP0405141A3

公开(公告)日：1991-06-12

申请号：EP90109910.1

申请日：1990-05-24

Applicant: MILES INC.

Inventor： Hunt, Robert N. ,  Sandridge, Robert L.

IPC: G01N21/35

CPC classification number: G01N21/3504 ,  G01J3/453 ,  G01N2021/178 ,  G01N2201/1215

Abstract: A particular area or areas are monitored for the presence of gaseous materials, particularly pollutants by analyzing background infrared radiation present in the selected area with a spectrometer and making the results of this analysis available in a form understandable to the person or device monitoring the area for the presence of specified gaseous materials. The results of the spectrometric analysis may, for example, be displayed on a video unit or they may be printed. Apparatus useful in the practice of this invention generally includes an interferometer of the Michaelson-Morely type having specific optical characteristics, a sensitive infrared detector, electronic data processor, and a device which records and/or displays the results of the determination(s). In a preferred embodiment, no radiation concentrating or focusing elements are used ahead of the beamsplitter of the Michelson-Morely interferometer, said interferometer having imaging optics which, combined with detector size, results in the optical field of view being essentially no larger than the area of the remote source employed.

公开(公告)号：EP0426011A1

公开(公告)日：1991-05-08

申请号：EP90120497.4

申请日：1990-10-25

Applicant: HORIBA, LTD.

Inventor： Ukon, Juichiro

IPC: G01J3/45

CPC classification number: G01J3/453

Abstract: In a two-beam interferometer for use in a Fourier transform spectrometer a swinging member (1) is provided with a pair of movable flat mirrors (2a, 2b) fixedly standing thereon oppositely in parallel at an interval, said swinging member (1) being adapted to be rotatably swung in planes meeting at right angles with directions in which said movable flat mirrors (2a, 2b) stand. Further, a beam splitter (4) making a reflected beam (5a) incident upon one of said pair of movable flat mirrors and making a transmitted beam (5b) incident upon the other of said a pair of movable flat mirrors and a pair of fixed mirrors (6a, 6b), upon which said reflected beam (5a) and said trans­mitted beam (5b) reflected by the respective movable flat mirrors are incident, and which make the respective beams incident upon said beam splitter (4) again through the respective movable flat mirrors, being arranged at positions other than the swing­ing member (1), such that the reflected beam (5a) and the transmitted beam (5b) incident upon the respective movable flat mirrors being incident upon the other opposite movable flat mirror and then upon said respective fixed mirrors (6a, 6b) and the beam splitter (4), respectively.

Abstract translation: 在用于在傅立叶使用双光束干涉仪变换光谱仪一摆动构件（1）上设置有一对可动平面镜（2A，2B）固定在间隔在平行站立在其上的相对的，所述摆动构件（1）是 angepasst可旋转地摆动，以直角与其中方向满足平面，所述可动平面镜（2A，2B）站。 另外，分束器（4）在所述一对可动平面镜中的一个使反射束（5A）入射，使反式mitted光束（5b）的入射到另一个所述的一对可动平面镜和一对固定 镜（6A，6B）在其中所述反射光束（5a）和所述由respectivement可动平面镜反mitted光束（5b）的反射入射，并且使respectivement光束入射到光束分离器（4）再次通过respectivement 可动平面镜，在比所述摆动构件（1）的其它位置被设置，检查做了反射光束（5a）和在所述respectivement可动平面镜入射在另一个上相对移动平面镜，然后将反式mitted光束（5b）的入射 在respectivement固定反射镜，所述（6A，6B）和分束器（4），分别。

公开(公告)号：EP0155142B1

公开(公告)日：1989-05-03

申请号：EP85301544.4

申请日：1985-03-06

Applicant: Secretary of State for Defence in Her Britannic Majesty's Gov. of the United Kingdom of Great Britain and Northern Ireland

Inventor： French, Herbert Alan

IPC: G01J3/453 ,  G01N21/39

CPC classification number: G01N21/39 ,  G01J3/453 ,  G01N2021/1795 ,  G01N2021/3531

公开(公告)号：EP0228702A2

公开(公告)日：1987-07-15

申请号：EP86118013.1

申请日：1986-12-23

Applicant: Bruker Analytische Messtechnik GmbH

Inventor： Fateley, William G.

IPC: G01J3/453 ,  G02F1/17 ,  G02F1/01

CPC classification number: G01J3/453

Abstract: An improved interferometer is provided which is of simplified construction and gives en­hanced, accurate interference analysis through pro­vision of an alterable masking device (14) located at the interference plane which facilitates rapid computer analysis of an interference pattern. The interferometer of the invention preferably includes a source of electromagnetic radiation, a beam splitter (22), a lens (28) for convergence and interference of the beams, a masking device (14) located at the region of beam convergence, and detection apparatus (16) for receiving and analyzing radiation from the mask. The mask is preferably stationary and elec­trically alterable and advantageously includes a base along with separate, plural masking structures (36-48) mounted on one base face with electrical connec­tions coupled to the separate masking structures. The masking structures are formed of a crystalline or polycrystalline thermo or electro diachromatic substance such as vanadium dioxide.

Abstract translation: 提供了一种改进的干涉仪，其具有简化的结构，并且通过提供位于干涉平面处的可变的掩蔽装置（14）来提供增强的，准确的干扰分析，其有利于快速计算机分析干涉图案。 本发明的干涉仪优选地包括电磁辐射源，分束器（22），用于束的会聚和干涉的透镜（28），位于束会聚区域处的掩蔽装置（14）和检测装置 （16），用于接收和分析来自掩模的辐射。 掩模优选地是固定的且可电可改变的，并且有利地包括底座以及安装在一个基面上的单独的多个掩蔽结构（36-48），其中电连接耦合到单独的掩蔽结构。 掩模结构由结晶或多晶的热或电二异氰酸物质如二氧化钒形成。

公开(公告)号：EP0155142A2

公开(公告)日：1985-09-18

申请号：EP85301544.4

申请日：1985-03-06

Applicant: Secretary of State for Defence in Her Britannic Majesty's Gov. of the United Kingdom of Great Britain and Northern Ireland

Inventor： French, Herbert Alan

IPC: G01J3/453 ,  G01N21/39

CPC classification number: G01N21/39 ,  G01J3/453 ,  G01N2021/1795 ,  G01N2021/3531

Abstract: A remote sensor for detecting gas, vapour or aerosol comprising means to measure the change in temporal coherence of light of a selected narrow waveband when it interacts with the gas etc. The light can be provided by a laser source or spectrally filtered sunlight etc. Received radiation 41 is split in to two, beams by a Fresnel biprism 44 and then detected by a detector 46 sensitised by a modulating reticle 47 to interference fringes. A glass delay plate 45 of suitable thickness is placed in the path of one of the beams such that only received radiation having a temporal coherence greater than a minimum determined by the plate thickness produces an output signal from detector 46. The minimum temporal coherence is set higher than the temporal coherence of the illuminating radiation. In alternative arrangements a band-pass temporal coherence filter may be used and the sensor can be made to spectrally scan the field of view by using a tunable laser or a variable centre frequency band-pass optical filter.