公开(公告)号：EP1611596A4

公开(公告)日：2007-08-01

申请号：EP04749376

申请日：2004-03-12

Applicant: JEOL USA INC

Inventor： CODY ROBERT B ,  LARAMEE JAMES A

IPC: H01J49/10 ,  B01D20060101 ,  G01N24/00 ,  G01N27/64 ,  H01J49/00 ,  H01J49/14 ,  H01J49/40

CPC classification number: H01J49/0459 ,  G01N27/622 ,  H01J49/00 ,  H01J49/10 ,  H01J49/14 ,  H05H1/34 ,  H05H2001/3447 ,  H05H2001/481

Abstract: A non-radioactive atmospheric pressure device for ionization of analytes comprises an atmospheric pressure chamber having an inlet for carrier gas, a first electrode at one end, and a counter-electrode at the other end of the chamber for creating an electrical discharge in the carrier gas thus creating metastable neutral excited-state species. Optionally, a grid is provided to generate electrons or ions by contact with the excited-state species. The carrier gas containing the excited-state species or the electrons generated therefrom is directed at an analyte at atmospheric pressure near ground potential to form analyte ions.

公开(公告)号：EP1566829A3

公开(公告)日：2006-08-02

申请号：EP04028501.7

申请日：2004-12-02

Applicant: Hansel, Armin, Dr. ,  Wisthaler, Armin, Dr.

Inventor： Hansel, Armin, Dr. ,  Wisthaler, Armin, Dr.

IPC: H01J49/14 ,  H01J49/04 ,  H01J49/26

CPC classification number: H01J49/04 ,  H01J49/145 ,  H01J49/26

Abstract: Bei einem Verfahren zur Gewinnung eines im Wesentlichen nur aus einer einzigen Ionensorte bestehenden Ausgangs-Ionenstroms werden bei der Ionisation eines Quellgases in einem Ionisationsbereich (A) gebildet Ionen und/oder aus dem Ionisationsbereich (A) extrahierte Ionen solange in einem Bereich (A, B, C), in welchem sich Quellgas befindet, reagieren gelassen, bis im Wesentlichen nur noch eine oder mehrere Quell-lonensorten vorliegen, die nicht mit dem Quellgas reagieren. Einem Reaktionsbereich (C), der sich außerhalb des lonisationsbereiches (A) befindet und in dem Ionen der ein oder mehreren Quell-Ionensorten vorhanden sind, wird ein vom Quellgas sich unterscheidendes Reaktantgas zugeführt, welches mit den Ionen der ein oder mehreren Quell-Ionensorten reagiert, wobei die Ionen der ein oder mehreren Quell-Ionensorten im Wesentlichen in die den Ausgangs-Ionenstrom bildende einzige lonensorte umgewandelt werden.

公开(公告)号：EP1659612A2

公开(公告)日：2006-05-24

申请号：EP05023178.6

申请日：2005-10-24

Applicant: Agilent Technologies, Inc. (a Delaware corporation)

Inventor： Wang, Mingda ,  Cirimele, Edward C.

IPC: H01J49/14

CPC classification number: H01J49/147 ,  H01J49/063

Abstract: An electron impact ion source includes an ionization chamber in which a first rf multipole field can be generated and an ion guide positioned downstream from the ionization chamber in which a second rf multipole field can be generated wherein electrons are injected into the ionization chamber along the axis (on-axis) to ionize an analyte sample provided to the ionization chamber.

Abstract translation: 电子碰撞离子源包括其中可以产生第一rf多极场的电离室和位于电离室下游的离子导向器，其中可以产生第二射频多极场，其中电子沿轴线注入电离室 （轴上）离子化提供给电离室的分析物样品。

公开(公告)号：EP1082750B1

公开(公告)日：2005-11-09

申请号：EP00913934.6

申请日：2000-03-15

Applicant: Varian, Inc.

Inventor： WELLS, Gregory, J. ,  YEE, Peter, P. ,  RUPORT, Marvin, A. ,  HUSTON, Charles, K.

IPC: H01J49/14

CPC classification number: H01J49/147

Abstract: An ion source (108) for use with an ion trap mass spectrometer (120). The ion source includes an electron source which produces a stream of electrons. The electrons are injected into an ionization chamber by the action of a repeller plate (104) and electron lens (106). Inside the ionization chamber, the electrons interact with a gas-phase sample to produce sample ions through the electron ionization process, or with a reagent gas to form reagent ions as part of a chemical ionization process. The sample ions produced are extracted from the ionization chamber by the action of an ion repeller (112) and an ion lens (105). The potentials on the electron repeller and lens, and ion repeller and lens are controlled to direct the electron stream away from the ionization chamber or to direct the sample ion beam away from an ion trap at the appropriate times during measurement of the sample ions.

公开(公告)号：EP0838080B1

公开(公告)日：2000-05-10

申请号：EP96922143.1

申请日：1996-07-02

Applicant: Ionoptika Limited

Inventor： HILL, Rowland ,  BLENKINSOPP, Paul, William, Miles

IPC: H01J49/40 ,  H01J49/14 ,  G01N23/225 ,  H01J37/256

CPC classification number: H01J49/40 ,  H01J37/256 ,  H01J49/06 ,  H01J49/142

Abstract: A sample analyzer comprising a time-of-flight mass spectrometer, guiding means for guiding the primary beam of the mass spectrometer onto the sample and through which the secondary beam (from the sample) passes, and switching means for switching the guiding means between a first condition for guiding the primary beam and a second condition for guiding the secondary beam. The guiding means may be a focusing means for focusing the primary and secondary beams or a steering means to steer the primary beam across the sample in a raster pattern.

公开(公告)号：EP0647963A3

公开(公告)日：1996-01-10

申请号：EP94307145.6

申请日：1994-09-29

Applicant: MARQUETTE ELECTRONICS, INC.

Inventor： Ellis, Donald G. ,  Micco, Alexander J. ,  Baer, Norman W.

IPC: H01J49/04 ,  H01J49/14 ,  H01J49/42 ,  H01J49/10

CPC classification number: H01J49/0422 ,  H01J49/08 ,  H01J49/147 ,  H01J49/4215

Abstract: A mass spectrometer system for gas analysis comprises an ion pump (12) for creating an internal vacuum within said mass spectrometer, an ionization chamber (26), an inlet passage (14) through which a gas sample is introduced into the ionization chamber, extraction means a quadrupole filter (50) into which the ions and electrons are directed by the extractor plate (48), the quadrupole filter (50) being operative to permit a stream of ions with a pre-selected mass-to-charge ratio to pass through the filter while ions other than those having the pre-selected mass-to-charge ratio separate from the stream of ions, means for directing electrons toward ions other than those having the pre-selected mass-to-charge ratio in the area of said quadrupole filter (50) so that the electrons combine with the ions, a sensor (64) for detecting the stream of ions passing through the quadrupole filter (50), and analyzing means (80) connected with the sensor for analyzing the components of the gas sample.

公开(公告)号：EP0647963A2

公开(公告)日：1995-04-12

申请号：EP94307145.6

申请日：1994-09-29

Applicant: MARQUETTE ELECTRONICS, INC.

Inventor： Ellis, Donald G. ,  Micco, Alexander J. ,  Baer, Norman W.

IPC: H01J49/04 ,  H01J49/14 ,  H01J49/42 ,  H01J49/10

CPC classification number: H01J49/0422 ,  H01J49/08 ,  H01J49/147 ,  H01J49/4215

Abstract: A mass spectrometer system for gas analysis comprises an ion pump (12) for creating an internal vacuum within said mass spectrometer, an ionization chamber (26), an inlet passage (14) through which a gas sample is introduced into the ionization chamber, extraction means a quadrupole filter (50) into which the ions and electrons are directed by the extractor plate (48), the quadrupole filter (50) being operative to permit a stream of ions with a pre-selected mass-to-charge ratio to pass through the filter while ions other than those having the pre-selected mass-to-charge ratio separate from the stream of ions, means for directing electrons toward ions other than those having the pre-selected mass-to-charge ratio in the area of said quadrupole filter (50) so that the electrons combine with the ions, a sensor (64) for detecting the stream of ions passing through the quadrupole filter (50), and analyzing means (80) connected with the sensor for analyzing the components of the gas sample.

Abstract translation: 用于气体分析的质谱仪系统包括用于在所述质谱仪内产生内部真空的离子泵（12），离子化室（26），将气体样品引入电离室的入口通道（14），阀 与入口通道相关联的用于控制引入电离室（26）的气体样品的体积的装置（18,20），用于将电子引入电离室（26）的细丝（32），由此电子轰击气体样品，因此 形成离子;邻近电离室（26）定位的提取器板（48），并被偏置，使得一部分离子和电子被允许通过提取器板;四极过滤器（50），离子和电子被定向到其中 通过提取器板（48），四极过滤器（50）可操作以允许具有预先选择的质荷比的离子流通过过滤器，而除了具有预选质量比 与离子流分离的质荷比，用于将电子引向除了在所述四极滤波器（50）的区域中具有预选质量 - 电荷比的那些之外的离子的装置，使得电子与 离子，用于检测通过四极过滤器（50）的离子流的传感器（64），以及与传感器连接的用于分析气体样品的分量的分析装置（80）。

公开(公告)号：EP0519693A1

公开(公告)日：1992-12-23

申请号：EP92305530.5

申请日：1992-06-17

Applicant: SHARP KABUSHIKI KAISHA

Inventor： Nakano, Akihiko

IPC: H01J49/14 ,  H01J37/252 ,  H01J37/02

CPC classification number: H01J37/02

Abstract: A reference grid for use in charged particle beam spectroscopes in analyzing an impurity contained in a target sample, which includes a grid composed of a material free of the impurity.

Abstract translation: 用于带电粒子束分光器中用于分析目标样品中所含杂质的参考栅格，其包括由不含杂质的材料构成的栅格。

公开(公告)号：EP0333912A3

公开(公告)日：1990-03-07

申请号：EP88111565.3

申请日：1988-07-19

Applicant: Bruker Franzen Analytik GmbH

Inventor： Schlag, Edward, Prof. Dr. ,  Lindner, Josef ,  Beavis, Ronald C., Dr. ,  Grotemeyer, J., Dr.

IPC: H01J49/14 ,  H05H3/02

CPC classification number: H05H3/02

Abstract: Beim Verdampfen einer aus großen Molekülen bestehenden probensubstanz, insbesondere zum Zweck massenspektroskopischer Untersuchungen, kann die zum Verdampfen zugeführte Energie eine thermolytische Zersetzung der Probensubstanz bewirken. Um eine solche Zersetzung zu verhindern, wird nach der Erfindung die Probensubstanz vor dem Bestrahlen mit einem Matrixmaterial vermischt, das aus einer unter der Wirkung des Laserstrahles leicht in gasförmige Moleküle zerfallenden Verbindung besteht. Dabei kann es sich um ein die Strahlung absorbierendes, thermolytisch leicht zerfallendes oder aber ein für die Laserstrahlung durchlässiges, aber mit einem Metallpulver versetztes Material handeln. Wird das Gemisch Laserstrahlimpulsen ausgesetzt, zerfällt zunächst das instabile Matrixmaterial und setzt dadurch die eingebetteten Moleküle der Probensubstanz frei. Insbesondere in Verbindung mit einem kühlenden Gasstrahl läßt sich so eine Zerstörung der Moleküle der Probensubstanz praktisch vollständig vermeiden. Geeignete Verbindungen für die Matrix sind insbesondere Zucker, Cellulose und NH₄NO₃ sowie Polyethylen mit einer Beimengung an Gold- oder Silberstaub.

公开(公告)号：EP0329461A3

公开(公告)日：1989-11-29

申请号：EP89301548.7

申请日：1989-02-17

Applicant: FISONS plc

Inventor： Haines, Raymond Clive, ,  Turner, Patrick James,

IPC: H01J49/14 ,  H01J49/06

CPC classification number: H01J49/06 ,  H01J49/14

Abstract: The invention provides a mass spectrometer comprising an ion source (1) provided with an electron emitting source (5) and magnets (6, 7) which are cooperable to produce a collimated electron beam (8) within the ion source; a mass analyzer (17); first and second electrodes (11, 44) which cooperate to limit the angular divergence of the ion beam which emerges from the source along the ion beam axis (10); and magnetic field screens (15, 42) disposed between the first and second electrode means, which reduce the field due to the magnets along the ion beam axis (10). In this way the mass discrimination introduced by the magnets in prior ion sources is reduced and the accuracy of isotopic ratio measurements is improved.