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    AXIAL ION SOURCE WITH MAGNETIC FIELD ADJUSTMENT
    1.
    发明公开
    AXIAL ION SOURCE WITH MAGNETIC FIELD ADJUSTMENT 审中-公开

    公开(公告)号：EP4498402A3

    公开(公告)日：2025-02-19

    申请号：EP24188836.1

    申请日：2024-07-16

    Applicant: Thermo Finnigan LLC

    Inventor： HOLDEN, Dustin D. ,  QUARMBY, Scott T. ,  GUCKENBERGER, George B.

    IPC: H01J49/14 ,  H01J27/20 ,  H01J27/02

    Abstract: Systems and methods taught herein generate a non-uniform magnetic field in the ionization region of an ion source to improve robustness in electrical and chemical ionization processes, particularly negative chemical ionization (CI) processes. The non-uniform magnetic field within the ionization volume spatially separates electrons and anions such that anions primarily pass through an ion exit aperture in the ionization chamber while electrons are directed to strike side walls or end walls of the ionization chamber away from the ion exit aperture. As a result, greater numbers of ions exit from the ion source towards a mass analyzer. Systems and methods taught herein also increase the longevity of instrumentation by avoiding damage that can be caused by electrons striking surfaces around apertures.

    AXIAL ION SOURCE WITH MAGNETIC FIELD ADJUSTMENT
    2.
    发明公开
    AXIAL ION SOURCE WITH MAGNETIC FIELD ADJUSTMENT 审中-公开

    公开(公告)号：EP4498402A2

    公开(公告)日：2025-01-29

    申请号：EP24188836.1

    申请日：2024-07-16

    Applicant: Thermo Finnigan LLC

    Inventor： HOLDEN, Dustin D. ,  QUARMBY, Scott T. ,  GUCKENBERGER, George B.

    IPC: H01J49/14 ,  H01J27/20 ,  H01J27/02

    Abstract: Systems and methods taught herein generate a non-uniform magnetic field in the ionization region of an ion source to improve robustness in electrical and chemical ionization processes, particularly negative chemical ionization (CI) processes. The non-uniform magnetic field within the ionization volume spatially separates electrons and anions such that anions primarily pass through an ion exit aperture in the ionization chamber while electrons are directed to strike side walls or end walls of the ionization chamber away from the ion exit aperture. As a result, greater numbers of ions exit from the ion source towards a mass analyzer. Systems and methods taught herein also increase the longevity of instrumentation by avoiding damage that can be caused by electrons striking surfaces around apertures.

    MASS SPECTROMETRY DEVICE AND MASS SPECTROMETRY METHOD
    5.
    发明公开
    MASS SPECTROMETRY DEVICE AND MASS SPECTROMETRY METHOD 审中-公开

    公开(公告)号：EP4279898A1

    公开(公告)日：2023-11-22

    申请号：EP21926748.1

    申请日：2021-12-06

    Applicant: Hamamatsu Photonics K.K.

    Inventor： HIRAO, Tsuyoshi ,  NAITO, Yasuhide ,  KOSUGI, Norimasa

    IPC: G01N1/28 ,  G01N27/62 ,  H01J49/00 ,  H01J49/02 ,  H01J49/06 ,  H01J49/14 ,  H01J49/16 ,  H01J49/40

    Abstract: The mass spectrometer includes a sample stage, an irradiation unit that irradiates the sample with an energy beam and ionizes a component of the sample while maintaining positional information of the sample in a region irradiated with the energy beam, an extraction electrode that extracts the ionized sample from the surface of the sample by a potential difference from the sample stage, an MCP that emits electrons in accordance with the ionized sample, an imaging part that acquires an image based on the electrons emitted by the MCP, and a control unit that controls operations of the irradiation unit, the extraction electrode, and the imaging part. The control unit changes the potential of the extraction electrode at a timing in accordance with the detection target component after the irradiation of the energy beam by the irradiation unit, and causes the imaging part to acquire an image as an analysis target in a period in accordance with the detection target component.

    ION SOURCE AND MASS SPECTROMETER EQUIPPED THEREWITH
    7.
    发明公开
    ION SOURCE AND MASS SPECTROMETER EQUIPPED THEREWITH 审中-公开

    公开(公告)号：EP4266040A1

    公开(公告)日：2023-10-25

    申请号：EP21906424.3

    申请日：2021-12-06

    Applicant: HITACHI HIGH-TECH CORPORATION

    Inventor： TERUI Yasushi ,  MARUOKA Kantarou

    IPC: G01N27/62 ,  H01J49/04 ,  H01J49/14

    Abstract: An ion source includes: an atomizer 100 configured to continuously introduce a liquid sample and atomize the liquid sample; a heating and mixing chamber 110 configured to vaporize the atomized liquid sample; and a charge supply unit 120 configured to ionize the vaporized liquid sample. The charge supply unit has a positive pressure with respect to the heating and mixing chamber. The vaporized liquid sample and a gaseous seed ion supplied from the charge supply unit are mixed in the heating and mixing chamber. An auxiliary gas for adjusting a gas flow rate in the heating and mixing chamber can be introduced into the heating and mixing chamber. The heating and mixing chamber has a chamber outlet configured to introduce the ionized liquid sample into a mass spectrometer. The chamber outlet is connected to a first pore 140 of the mass spectrometer. Accordingly, an ion source capable of stabilizing the number of ions generated from a liquid measurement sample and introduced into a device, and a mass spectrometer including the ion source are provided.

    SOURCE-DETECTOR SYNCHRONIZATION IN MULTIPLEXED SECONDARY ION MASS SPECTROMETRY
    10.
    发明公开
    SOURCE-DETECTOR SYNCHRONIZATION IN MULTIPLEXED SECONDARY ION MASS SPECTROMETRY 审中-公开

    公开(公告)号：EP4163637A1

    公开(公告)日：2023-04-12

    申请号：EP22188245.9

    申请日：2019-02-28

    Applicant: Ionpath, Inc.

    Inventor： STUMBO, David ,  BENDALL, Sean ,  ANGELO, Michael ,  THOMPSON, Stephen ,  FIENBERG, Harris

    IPC: G01N33/68 ,  H01J49/14

    Abstract: The disclosure features methods and systems that include directing an ion beam to a region of a sample to liberate charged particles from the region of the sample, where the directed ion beam is pulsed at a first repetition rate, deflecting a first subset of the liberated charged particles from a first path to a second path different from the first path in response to a gate signal synchronized with the repetition rate of the pulsed ion beam, and detecting the first subset of the liberated charged particles in a time-of-flight (TOF) mass spectrometer to determine information about the sample, where the gate signal sets a common reference time for the TOF mass spectrometer for the first subset of charged particles liberated by each pulse of the ion beam.

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