3-DIMENSIONAL MEASUREMENT APPARATUS AND 3-DIMENSIONAL MEASUREMENT METHOD

    公开(公告)号:EP4417936A1

    公开(公告)日:2024-08-21

    申请号:EP24158542.1

    申请日:2024-02-20

    申请人: JUKI Corporation

    发明人: SENGA, Daisuke

    IPC分类号: G01B11/25 G06T7/521

    摘要: A 3-dimensional measurement apparatus includes: a projection device configured to project a stripe pattern of a sinusoidal brightness distribution to an object; an imaging device configured to image the object to which the stripe pattern is projected; and a control device configured to control the projection device and the imaging device. The control device includes a pattern generation unit, an image data acquisition unit, a phase value calculation unit, a collation unit, and a 3-dimensional shape calculation unit. The collation unit collates a first phase value with a second phase value and specifies noise. The 3-dimensional shape calculation unit calculates a 3-dimensional shape of an object based on the first phase value in which the noise is determined not to be contained.