3-DIMENSIONAL MEASUREMENT APPARATUS AND 3-DIMENSIONAL MEASUREMENT METHOD

    公开(公告)号:EP4417936A1

    公开(公告)日:2024-08-21

    申请号:EP24158542.1

    申请日:2024-02-20

    Inventor: SENGA, Daisuke

    CPC classification number: G01B11/2527 G01B11/2513 G06T7/521

    Abstract: A 3-dimensional measurement apparatus includes: a projection device configured to project a stripe pattern of a sinusoidal brightness distribution to an object; an imaging device configured to image the object to which the stripe pattern is projected; and a control device configured to control the projection device and the imaging device. The control device includes a pattern generation unit, an image data acquisition unit, a phase value calculation unit, a collation unit, and a 3-dimensional shape calculation unit. The collation unit collates a first phase value with a second phase value and specifies noise. The 3-dimensional shape calculation unit calculates a 3-dimensional shape of an object based on the first phase value in which the noise is determined not to be contained.

    TARGET WITH FEATURES FOR 3-D SCANNER CALIBRATION

    公开(公告)号:EP3368858A1

    公开(公告)日:2018-09-05

    申请号:EP15906991.3

    申请日:2015-10-30

    Inventor: GLINEC, Yannick

    CPC classification number: G01B11/2504 A61C9/006 G01B11/2513 G01B21/042

    Abstract: An apparatus (70) for surface contour imaging of an object has an illumination apparatus energizable to direct one or more illumination patterns (46) toward a surface position. A sensing apparatus (40) has at least one lens (34) and a sensor (30) that is energizable to obtain one or more images of the surface position corresponding to the illumination patterns (46). A calibration target (100) is detachably coupled to the apparatus (70) in the surface position, wherein the calibration target (100) has a set having a plurality of raised features (50) that are uniformly spaced apart with respect to first and second orthogonal axes that define a first plane and having a uniform height along a height axis that is orthogonal to the first plane. The raised features (50) further have at least a first slanted surface (54) that is oblique with respect to the first plane and oblique with respect to the height axis.

    MULTI-LINE ARRAY LASER THREE-DIMENSIONAL SCANNING SYSTEM, AND MULTI-LINE ARRAY LASER THREE-DIMENSIONAL SCANNING METHOD

    公开(公告)号:EP3348958A1

    公开(公告)日:2018-07-18

    申请号:EP16843363.9

    申请日:2016-01-28

    Abstract: The present invention provides a multi-line array laser three-dimensional scanning system and a multi-line array laser three-dimensional scanning method, the system performs precise synchronization and logic control of the multi-line array laser three-dimensional scanning system by a programmable gate array FPGA; employs a line laser array as the projection pattern light source, sends trigger signals to a stereoscopic image sensor, a inertial sensor and a line laser array by FPGA; wherein a upper computer receives image pairs taken by the stereoscopic image sensor, and codes, decodes as well as performs a three-dimensional reconstruction for the laser line array patterns in the image pairs, performs a three-dimensional reconstruction for the feature points on the surface of the measured object, and matches and aligns the three-dimensional feature points at different times; the system predicts and corrects the matching calculation by employing a hybrid sensing technology, which registers and stitches the time domain laser three-dimensional scanning data, meanwhile evaluates the error level in real time and feeds it back to an error feedback controller to obtain an adjustment instruction. Thereby the system performs a laser three-dimensional scanning with low cost, high efficiency, high reliability and high accuracy.

Patent Agency Ranking