摘要:
Instruments for measuring and/or controlling the thickness of a coating applied to a substrate are provided. Methods for measuring the dry thickness of the coating utilizing instruments of the invention are also provided.
摘要:
Instruments for measuring and/or controlling the thickness of a coating applied to a substrate are provided. Methods for measuring the dry thickness of the coating utilizing instruments of the invention are also provided.
摘要:
An instrument is described for measuring the thickness of a paint coating on a rotating roll of a roll coating applicator roll for determination of the thickness of a paint coating to be applied to a moving substrate comprising: sensor means arranged for emitting and detecting signals reflected from the surface of the paint coating on at least one roll of the roll coating applicator to generate data indicative of the position of the surface of the paint on the roll, the sensor means being distanced from the paint coating for the emission and detection of the signals; and processing means for processing the data generated by the sensor means to determine the thickness of the paint coating to be applied to the substrate.
摘要:
There are provided instruments for measuring and/or controlling the thickness of a coating applied to a substrate. An instrument embodied by the invention comprises coating removal means for removing a quantity of the coating to partially expose the surface of the substrate. The instrument also includes sensor means for emitting and detecting signals reflected from the surface of the coating and the exposed surface of the substrate to generate one or more data sets consisting of data indicative of the position of the surface of the coating and the position of the surface of the substrate. The sensor means is arranged so as to be distanced from the coating and the substrate, and is adapted to detect the signals reflected from the surface of the substrate during relative movement between the substrate and the sensor means. The data sets generated by the sensor means are processed by processing means of the instrument to determine the dry thickness of the coating on the substrate. Methods for measuring the dry thickness of the coating utilising instruments of the invention are also provided.