摘要:
A tester (10) for electrical traces (85) such as on a circuit board (80) includes an electromagnetic beam source (20) such as a laser producing an ultraviolet beam (24), a vacuum chamber (12), an electrode circuit (49) including electrodes (51) and corresponding electronics (55) including ammeters (59) for measuring photoelectron flow between traces (85) and electrodes (51), a controller (71), laser beam optics (41, 44, 46), an image acquisition system, and a pair of broadband UV lights. The board containing traces (85) under test is disposed in the vacuum chamber (12) at lowered pressure with grid electrodes (51) lying close to the trace area (85) on each side of the board. Electrode electronics (55) selectively maintain a known potential on each electrode (51). The exact location of traces (85) are determined by an image acquisition system. The board (80) and traces (85) are initialized to a known voltage. Photoelectric effect using ultraviolet laser beams (24) is used to determine continuity between two points (87) on a trace (85) and shorts between traces (85).