公开(公告)号：EP4439054A1

公开(公告)日：2024-10-02

申请号：EP22898309.4

申请日：2022-10-26

Applicant: EM Labs, Inc.

Inventor： YANAGIMOTO, Yoshiyuki ,  HATTORI, Atsushi

IPC: G01N22/00

CPC classification number: G01N22/00 ,  G01R27/2658 ,  G01N27/026

Abstract: In a dielectric characteristic measurement method, a step of mounting a sample of which dielectric characteristic is measured on an open resonator and adjusting a position of the sample includes: a first measurement step for performing a first resonance measurement by sweeping a predetermined sweep frequency range at a first number of measurement points; and a second and subsequent measurement steps for performing a plurality times of resonance measurement following the first resonance measurement, wherein each of the plurality times of resonance measurement is performed by sweeping a sweep frequency range specified based on an immediately preceding resonance measurement at a second number of the measurement points which is less than the first number of the measurement points, and the sweep frequency range of a second resonance measurement in the plurality times of resonance measurement is specified based on the first resonance measurement.

公开(公告)号：EP4450958A1

公开(公告)日：2024-10-23

申请号：EP22907036.2

申请日：2022-10-26

Applicant: EM Labs, Inc.

Inventor： YANAGIMOTO Yoshiyuki

IPC: G01N22/00

Abstract: An open resonator capable of measuring dielectric characteristic of a sample having anisotropy in a dielectric constant with high accuracy. The open resonator includes two spherical reflection mirrors respectively having two reflection spherical surfaces which are arranged to face each other; and a signal injection portion for inputting an input signal used for measuring a dielectric characteristic of a sample arranged between the two reflection spherical surfaces. At least one of the two spherical reflection mirrors has a groove formed along at least one of the two reflection spherical surfaces of the at least one of the two spherical reflection mirrors.