公开(公告)号：EP1424547A2

公开(公告)日：2004-06-02

申请号：EP03256385.0

申请日：2003-10-09

申请人： Instron Limited

发明人： Hayford, Paul D. ,  Long, David W.

IPC分类号： G01N3/00

CPC分类号： G01N21/01 ,  G01N3/02 ,  G01N2201/0233 ,  G01N2203/0017 ,  G01N2203/0025 ,  G01N2203/0238 ,  G01N2203/0242 ,  G01N2203/0647

摘要： Test apparatus comprising means for holding a sample to be tested, means for altering the strain in the sample, an optical arrangement for monitoring the sample to be tested, and processing means for processing the signals resulting from the monitoring of the sample under test, wherein the environment between the optical arrangement and the sample under test is controlled, and wherein the sample to be tested is located in a position external to the controlled environment.

摘要翻译： 测试装置，包括用于保持待测试样品的装置，用于改变样品中的应变的装置，用于监测待测试样品的光学装置，以及用于处理由待测试样品监测产生的信号的处理装置，其中 控制光学布置和被测试样品之间的环境，并且其中待测试样品位于受控环境外部的位置。

公开(公告)号：EP1424547A3

公开(公告)日：2004-10-27

申请号：EP03256385.0

申请日：2003-10-09

申请人： Instron Limited

发明人： Hayford, Paul D. ,  Long, David W.

IPC分类号： G01N3/00

CPC分类号： G01N21/01 ,  G01N3/02 ,  G01N2201/0233 ,  G01N2203/0017 ,  G01N2203/0025 ,  G01N2203/0238 ,  G01N2203/0242 ,  G01N2203/0647

摘要： Test apparatus comprising means for holding a sample to be tested, means for altering the strain in the sample, an optical arrangement for monitoring the sample to be tested, and processing means for processing the signals resulting from the monitoring of the sample under test, wherein the environment between the optical arrangement and the sample under test is controlled, and wherein the sample to be tested is located in a position external to the controlled environment.