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公开(公告)号:EP4428544A3
公开(公告)日:2024-12-18
申请号:EP24172195.0
申请日:2018-05-10
Applicant: Tektronix, Inc.
Inventor: MENDE, Michael J. , BOOMAN, Richard A.
Abstract: The disclosure includes an electro-optical sensor. The electro-optical sensor includes a test signal input to receive a test signal from a device under test (DUT). A bias circuit is employed to generate a bias signal. The electro-optical sensor also includes a Mach-Zehnder Modulator (MZM) that employs an optical input, an optical output, and a bias input. The MZM is configured to receive an optical carrier signal via the optical input. The MZM also receives both the test signal and the bias signal on the bias input. The MZM modulates the test signal from the bias input onto the optical carrier to generate an optical signal while operating in a mode selected by the bias signal. The MZM also outputs the optical signal over the optical output.
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公开(公告)号:EP4417981A3
公开(公告)日:2024-11-27
申请号:EP24172190.1
申请日:2018-05-10
Applicant: Tektronix, Inc.
Inventor: MENDE, Michael , BOOMAN, Richard , ENGQUIST, David
Abstract: Disclosed is a differential test probe tip. The probe tip comprises a socket of electrically conductive material at a proximate end of the probe tip. The socket includes a concavity to receive a signal pin. The probe tip also comprises a reference body of conductive material surrounding the socket. The probe tip further comprises a insulating spacer element of nonconductive material surrounding the reference body at the proximate end of the probe tip. The insulating spacer element includes a signal port to receive the signal pin into the socket. The insulating spacer element further includes a reference port to receive a reference pin and maintain the reference pin in electrical communication with a proximate end of the reference body.
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公开(公告)号:EP4421499A3
公开(公告)日:2024-11-13
申请号:EP24173677.6
申请日:2017-03-17
Applicant: Tektronix, Inc.
Inventor: MENDE, Michael J. , REED, Gary W. , PILEGGI, James D. , RINDER, Karl A. , BOOMAN, Richard A. , VAN PELT, Martin
Abstract: A flexible resistive tip cable assembly includes a probe Radio Frequency (RF) connector structured to receive a RF differential signal and a testing connection assembly. A coaxial cable is structured to conduct the RF differential signal between the probe RF connector and the testing connection assembly. The coaxial cable includes a cable for conducting the differential signal, and a plurality of magnetic elements positioned along a length of the cable and structured to isolate the differential signal from common mode interference. The magnetic elements are separated from adjacent magnetic elements by a gap with elastomeric elements is positioned in each gap to provide cable flexibility. The assembly may also include an Electrically Erasable Programmable Read Only Memory (EEPROM) loaded with an attenuation associated with the flexible resistive tip cable assembly for use in signal testing by a device coupled to the testing connection assembly.
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公开(公告)号:EP4428544A2
公开(公告)日:2024-09-11
申请号:EP24172195.0
申请日:2018-05-10
Applicant: Tektronix, Inc.
Inventor: MENDE, Michael J. , BOOMAN, Richard A.
IPC: G01R15/24
CPC classification number: G01R15/241
Abstract: The disclosure includes an electro-optical sensor. The electro-optical sensor includes a test signal input to receive a test signal from a device under test (DUT). A bias circuit is employed to generate a bias signal. The electro-optical sensor also includes a Mach-Zehnder Modulator (MZM) that employs an optical input, an optical output, and a bias input. The MZM is configured to receive an optical carrier signal via the optical input. The MZM also receives both the test signal and the bias signal on the bias input. The MZM modulates the test signal from the bias input onto the optical carrier to generate an optical signal while operating in a mode selected by the bias signal. The MZM also outputs the optical signal over the optical output.
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公开(公告)号:EP4296698A1
公开(公告)日:2023-12-27
申请号:EP23178256.6
申请日:2023-06-08
Applicant: Tektronix, Inc.
Inventor: PICKERD, John J. , SHARMA, Ajaiey Kumar , TAN, Kan
IPC: G01R27/32
Abstract: A test and measurement instrument includes one or more ports to connect to one or more devices under test (DUT) having tuning screws, and to a robot, one or more processors to configured to: send commands to the robot to position the tuning screws on the one or more DUTs to one or more sets of positions, each set of positions being a parameter set for the tuning screws, acquire a set of operating parameters for each parameter set from the one or more DUTs, generate a parameter set image for each set, create a combined image of the parameter set images, provide the combined image to a machine learning system to obtain a predicted set of values, adjust the predicted set of values to produce a set of predicted positions, send commands to the robot to position the tuning screws to positions in the set of predicted positions, obtain a set of tuned operating parameters from the one or more DUTs, and validate operation of the one or more DUTs.
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公开(公告)号:EP3203244B1
公开(公告)日:2020-11-04
申请号:EP17154703.7
申请日:2017-02-03
Applicant: Tektronix, Inc.
Inventor: KNIERIM, Daniel G , KELLY, David L. , SMITH, Patrick A.
IPC: G01R13/02
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公开(公告)号:EP2913684B1
公开(公告)日:2020-09-16
申请号:EP15156242.8
申请日:2015-02-24
Applicant: Tektronix, Inc.
Inventor: Mende, Michael , Booman, Richard
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公开(公告)号:EP2829883B1
公开(公告)日:2020-03-25
申请号:EP14178601.2
申请日:2014-07-25
Applicant: Tektronix, Inc.
Inventor: Sri, Krishna , Patro, Gajendra , Bal, Abhinav , M N, Gurushiddappa
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公开(公告)号:EP2849347B1
公开(公告)日:2020-02-26
申请号:EP14184682.4
申请日:2014-09-12
Applicant: Tektronix, Inc.
Inventor: Pickerd, John
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公开(公告)号:EP2876452B1
公开(公告)日:2019-12-25
申请号:EP15150998.1
申请日:2010-09-08
Applicant: Tektronix, Inc.
Inventor: Dobyns, Kenneth P.
IPC: G01R13/00 , G01R31/3167
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