利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

92 条记录 (耗时 0.022 秒)

    ION TRAP ARRAY FOR HIGH THROUGHPUT CHARGE DETECTION MASS SPECTROMETRY
    6.
    发明公开
    ION TRAP ARRAY FOR HIGH THROUGHPUT CHARGE DETECTION MASS SPECTROMETRY 审中-实审

    公开(公告)号：EP4391015A2

    公开(公告)日：2024-06-26

    申请号：EP24174366.5

    申请日：2019-01-11

    申请人： The Trustees of Indiana University

    发明人： JARROLD, Martin F. ,  BOTAMANENKO, Daniel

    IPC分类号： H01J49/42

    CPC分类号： H01J49/4245

    摘要： An electrostatic linear ion trap (ELIT) array includes multiple elongated charge detection cylinders arranged end-to-end and each defining an axial passageway extending centrally therethrough, a plurality of ion mirror structures each defining a pair of axially aligned cavities and an axial passageway extending centrally therethrough, wherein a different ion mirror structure is disposed between opposing ends of each cylinder, and front and rear ion mirrors each defining at least one cavity and an axial passageway extending centrally therethrough, the front ion mirror positioned at one end of the arrangement of charge detection cylinders and the rear ion mirror positioned at an opposite end of the arrangement of charge detection cylinders, wherein the axial passageways of the charge detection cylinders, the ion mirror structures, the front ion mirror and the rear ion mirror are coaxial to define a longitudinal axis passing centrally through the ELIT array.

    CHARGE DETECTION MASS SPECTROMETRY WITH REAL TIME ANALYSIS AND SIGNAL OPTIMIZATION
    8.
    发明公开
    CHARGE DETECTION MASS SPECTROMETRY WITH REAL TIME ANALYSIS AND SIGNAL OPTIMIZATION 审中-实审

    公开(公告)号：EP4376051A2

    公开(公告)日：2024-05-29

    申请号：EP24169520.4

    申请日：2019-01-11

    申请人： The Trustees of Indiana University

    发明人： JARROLD, Martin F. ,  DRAPER, Benjamin E.

    IPC分类号： H01J49/02

    CPC分类号： H01J49/027 ,  H01J49/4245

    摘要： A charge detection mass spectrometer may include an electrostatic linear ion trap (ELIT) or an orbitrap, an ion source to supply ions thereto, at least one amplifier operatively coupled to the ELIT or orbitrap, a processor coupled to ELIT or orbitrap and to the amplifier(s), and processor programmed to control the ELIT or orbitrap as part of a trapping event to attempt to trap therein a single ion supplied by the ion source, to record ion measurement information based on output signals produced by the amplifier(s) over a duration of the trapping event, to determine, based on the measurement information, whether the control of the ELIT or orbitrap resulted in trapping of a single ion, no ion or multiple ions, and to compute an ion mass or mass-to-charge ratio from the measurement information only if a single ion was trapped during the trapping event.