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1.发明公开
公开(公告)号：EP2577226A2
公开(公告)日：2013-04-10
申请号：EP11728326.7
申请日：2011-05-30
发明人： GAUJE, Pierre
摘要： Process and device for measuring the thickness of a layer of coating material of a running strip according to which a quantity representative of the thickness of the coating layer is measured, using an eddy-current sensor, for at least one region of the strip, and the thickness of the coating layer is determined using the measured quantity and at least one calibration value. The measurement made using an eddy-current sensor comprises measuring the complex impedance of a coil facing the running strip for a low-frequency excitation and a high-frequency excitation and the calculation of a quantity representative of the thickness of the coating layer using said complex-impedance measurements. Device for implementing the process and coating plant equipped with the device.
摘要翻译： 一种用于通过对所述条带中的至少一个区域的涡流传感器来测量的行驶条雅丁到其中，涂层材料层的厚度的方法和装置，将一定量的测量，代表被覆层的厚度的 和涂布层的厚度是确定的从所述测量的量和由至少一个校准值开采。 用在涡电流传感器进行的测量包括面向用于低激励频率的运行条和高激励频率和数量代表被覆层的厚度为所述复合阻抗的拟订的线圈的复阻抗的测量 测量。 一种用于实施该方法以及配备有该装置的涂布装置的安装。
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2.发明授权
公开(公告)号：EP2577226B1
公开(公告)日：2018-02-21
申请号：EP11728326.7
申请日：2011-05-30
申请人： ArcelorMittal
发明人： GAUJE, Pierre
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公开(公告)号：EP4402427A1
公开(公告)日：2024-07-24
申请号：EP21777860.4
申请日：2021-09-17
申请人： ArcelorMittal
发明人： AMOURAK, Mounir , MADELAINE-DUPUICH, Olivier , HEMMEN, Jean-Marc , GAUJE, Pierre , SPONEM, Florent
CPC分类号： G01B11/18 , G01B21/042 , B21D1/02
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