公开(公告)号：EP0449442A1

公开(公告)日：1991-10-02

申请号：EP91301874.3

申请日：1991-03-06

Applicant: BECKMAN INSTRUMENTS, INC.

Inventor： Kaye, Wilbur Irving

IPC: G01J3/42

CPC classification number: G01J3/2803 ,  G01J3/28 ,  G01N2201/064

Abstract: A method of measuring and compensating stray light in absorbance analysis that use a multiple element array detector (54) wherein one or more of the elements of the diode array are utilized to detect stray radiation in the absence of primary radiation including higher order diffracted radiation. In one aspect, the atmosphere is used to filter all primary radiation below a particular wavelength so that one or more array elements corresponding to detection below such wavelength can be dedicated to the detection of only stray radiation. Detection of higher order diffractions can be prevented by dividing the total spectrum into intervals and detecting these intervals in sequence. In another aspect, a diode array is designed to include additional elements along one side of the array outside the exposure of the primary radiation for the sole purpose of detecting stray radiation.

Abstract translation: 一种在吸光度分析中测量和补偿杂散光的方法，其使用多元素阵列检测器（54），其中二极管阵列的一个或多个元件用于在不存在包括较高阶衍射辐射在内的主辐射的情况下检测杂散辐射。 在一个方面，气氛用于过滤低于特定波长的所有初级辐射，使得对应于低于这种波长的检测的一个或多个阵列元件可专用于仅检测杂散辐射。 可以通过将总谱除以间隔并依次检测这些间隔来防止高阶衍射的检测。 在另一方面，二极管阵列被设计为在唯一的目的是检测杂散辐射的情况下，在主辐射暴露之外包括沿阵列的一侧的附加元件。