Apparatus and methods for inspection of electrical materials and components
    1.
    发明公开
    Apparatus and methods for inspection of electrical materials and components 失效
    装置和用于电气材料和部件的检查方法。

    公开(公告)号:EP0251500A1

    公开(公告)日:1988-01-07

    申请号:EP87304863.1

    申请日:1987-06-02

    IPC分类号: G01R29/12 G01R31/28

    摘要: A capacitor has a top plate 2 in the form of a photodiode assay and a bottom plate 2. An RF source 3 is connected between plates 1 and 2. Insulating or semiconducting material to be tested is inserted between the plates 1 and 2 to act as dielectric. Where a printed circuit board or other conductive electrical component is to be tested it forms bottom plate 2. A flying spot scanner 11 produces a modulated light beam 12 which scans the top surface of plate 1. The resulting modula-ted photocurrent envelope is detected and displayed in a display monitor 15 in synchronism with the scanning beam.

    摘要翻译: 一种电容器具有顶板2中2.一种RF源3连接板1和2的绝缘或半导体材料待测试插入在板1和2以用作之间的光电二极管测定和底部板的形式 介质。 其中的印刷电路板或其他电气元件的导电是要被测试它形成底板2,一种飞点扫描器11产生一个调制的光束12,其扫描板1的上表面被检测到并且在显示得到的调制光电流的包络 与扫描光束同步的显示监视器15。