摘要:
A micro-displacement type information detection probe device capable of following all of the undulation on the µm order, etc. and the periodical surface unevenness on the nm order, etc. of the recording medium or the substrate in performing recording, reproduction, etc. by use of tunnel current, etc. is provided. By forming a cantilever 701 of the first stage by extending the insulation layer laminated on the substrate, providing a layer structure 708 - 710 having a piezoelectric material sandwiched between the electrode members on the cantilever of the first stage, forming further a cantilever 702 of the second stage on the extension from the tip end of the first cantilever having said layer structure and also forming an information detection probe 703 at the free end of the cantilever of said second stage, and utilizing the reverse piezoelectric effect formed by application of a voltage between the electrodes of said layer structure, the cantilever 701 of the above first stage is displaced.
摘要:
A micro-displacement type information detection probe device capable of following all of the undulation on the µm order, etc. and the periodical surface unevenness on the nm order, etc. of the recording medium or the substrate in performing recording, reproduction, etc. by use of tunnel current, etc. is provided. By forming a cantilever 701 of the first stage by extending the insulation layer laminated on the substrate, providing a layer structure 708 - 710 having a piezoelectric material sandwiched between the electrode members on the cantilever of the first stage, forming further a cantilever 702 of the second stage on the extension from the tip end of the first cantilever having said layer structure and also forming an information detection probe 703 at the free end of the cantilever of said second stage, and utilizing the reverse piezoelectric effect formed by application of a voltage between the electrodes of said layer structure, the cantilever 701 of the above first stage is displaced.
摘要:
A method of access of a probe electrode to a recording medium having on the surface thereof an edge portion having a level difference larger than a recording recess-projection or having an electron state different from a recording electron state comprises steps of detecting the edge portion ; causing the probe electrode to scan at a certain angle to the edge portion; and moving the recording medium to a direction along the edge portion. A method for processing information including recording, reproducing, and erasing of information by access of a probe electrode to a recording medium having on the surface thereof an edge portion having a level difference larger than a recording recess-projection or having an electron state different from a recording electron state comprises steps of detecting the edge portion ; causing the probe electrode to scan at a certain angle to the edge portion ; and applying a pulse voltage for recording or erasing, or a bias voltage for reproducing information between the recording medium and the probe electrode.