Method and system for measuring display attributes of a fed
    1.
    发明公开
    Method and system for measuring display attributes of a fed 审中-公开
    Verfahren und System zur Messung der Anzeigeattribute einerZuführung

    公开(公告)号:EP2131345A2

    公开(公告)日:2009-12-09

    申请号:EP09011212.9

    申请日:2002-06-24

    CPC classification number: G09G3/22 G09G2320/0233 G09G2320/0285

    Abstract: In a field emission display (FED) device comprising: rows and columns of emitters; and an anode electrode, a method of measuring display attributes of said FED device comprising the steps of: a) in a scan fashion, individually driving each row and measuring the current drawn by each row, wherein a settling time is allowed after each row is driven; b) measuring a background current level during a vertical blanking interval; c) correcting current measurements taken during said step a) by said background current level to yield corrected current measurements; d) averaging multiple corrected current measurements taken over multiple display frames to produce averaged corrected current values for all rows of said FED device; and e) generating a memory resident correction table based on said averaged corrected current values.

    Abstract translation: 在场发射显示器(FED)装置中,包括:发射器的行和列; 以及阳极电极,测量所述FED器件的显示属性的方法,包括以下步骤:a)以扫描的方式单独驱动每行并测量每行绘制的电流,其中在每行之后允许建立时间为 驱动; b)在垂直消隐间隔期间测量背景电流电平; c)校正在所述步骤a)期间通过所述背景电流电平进行的电流测量,以产生校正的电流测量; d)平均在多个显示帧上拍摄的多个校正电流测量值,以产生所述FED设备的所有行的平均校正电流值; 以及e)基于所述平均校正的电流值产生存储器驻留校正表。

    Method and system for measuring display attributes of a fed
    3.
    发明公开
    Method and system for measuring display attributes of a fed 审中-公开
    方法和系统,用于测量进料的显示属性

    公开(公告)号:EP2131345A3

    公开(公告)日:2010-03-03

    申请号:EP09011212.9

    申请日:2002-06-24

    CPC classification number: G09G3/22 G09G2320/0233 G09G2320/0285

    Abstract: In a field emission display (FED) device comprising: rows and columns of emitters; and an anode electrode, a method of measuring display attributes of said FED device comprising the steps of: a) in a scan fashion, individually driving each row and measuring the current drawn by each row, wherein a settling time is allowed after each row is driven; b) measuring a background current level during a vertical blanking interval; c) correcting current measurements taken during said step a) by said background current level to yield corrected current measurements; d) averaging multiple corrected current measurements taken over multiple display frames to produce averaged corrected current values for all rows of said FED device; and e) generating a memory resident correction table based on said averaged corrected current values.

Patent Agency Ranking